Growing community of inventors

Chung-Ho, Taiwan

Andy Tsen

Average Co-Inventor Count = 4.38

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 100

Andy TsenJong-I Mou (10 patents)Andy TsenPo-Feng Tsai (6 patents)Andy TsenJo Fei Wang (4 patents)Andy TsenSunny Wu (4 patents)Andy TsenMing-Yu Fan (3 patents)Andy TsenJin-Ning Sung (3 patents)Andy TsenWang Jo Fei (3 patents)Andy TsenChih-Wei Hsu (2 patents)Andy TsenChun-Hsien Lin (2 patents)Andy TsenJill Wang (2 patents)Andy TsenChia-Hung Huang (1 patent)Andy TsenYu-Jen Cheng (1 patent)Andy TsenShin-Rung Lu (1 patent)Andy TsenJui-Long Chen (1 patent)Andy TsenWen-Pin Liu (1 patent)Andy TsenMing-Yeon Hung (1 patent)Andy TsenChih-Sheng Shih (1 patent)Andy TsenHsin Kuan (1 patent)Andy TsenYen-Wei Cheng (1 patent)Andy TsenShun-Ping Wang (1 patent)Andy TsenAndy Tsen (12 patents)Jong-I MouJong-I Mou (54 patents)Po-Feng TsaiPo-Feng Tsai (21 patents)Jo Fei WangJo Fei Wang (25 patents)Sunny WuSunny Wu (22 patents)Ming-Yu FanMing-Yu Fan (8 patents)Jin-Ning SungJin-Ning Sung (7 patents)Wang Jo FeiWang Jo Fei (3 patents)Chih-Wei HsuChih-Wei Hsu (241 patents)Chun-Hsien LinChun-Hsien Lin (33 patents)Jill WangJill Wang (2 patents)Chia-Hung HuangChia-Hung Huang (26 patents)Yu-Jen ChengYu-Jen Cheng (22 patents)Shin-Rung LuShin-Rung Lu (13 patents)Jui-Long ChenJui-Long Chen (12 patents)Wen-Pin LiuWen-Pin Liu (6 patents)Ming-Yeon HungMing-Yeon Hung (3 patents)Chih-Sheng ShihChih-Sheng Shih (3 patents)Hsin KuanHsin Kuan (2 patents)Yen-Wei ChengYen-Wei Cheng (2 patents)Shun-Ping WangShun-Ping Wang (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Taiwan Semiconductor Manufacturing Comp. Ltd. (12 from 40,635 patents)


12 patents:

1. 8437870 - System and method for implementing a virtual metrology advanced process control platform

2. 8396583 - Method and system for implementing virtual metrology in semiconductor fabrication

3. 8394719 - System and method for implementing multi-resolution advanced process control

4. 8392009 - Advanced process control with novel sampling policy

5. 8239056 - Advanced process control for new tapeout product

6. 8229588 - Method and system for tuning advanced process control parameters

7. 8224475 - Method and apparatus for advanced process control

8. 8219341 - System and method for implementing wafer acceptance test ('WAT') advanced process control ('APC') with routing model

9. 8108060 - System and method for implementing a wafer acceptance test ('WAT') advanced process control ('APC') with novel sampling policy and architecture

10. 8082055 - Method for a bin ratio forecast at new tape out stage

11. 8041451 - Method for bin-based control

12. 7951615 - System and method for implementing multi-resolution advanced process control

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12/4/2025
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