Honeywell International Inc.

Vibrant Corporation

Andy Kinney

Surendra Singh

Robert Hogan

Mark C Morris

Donald G Godfrey

Vladimir K Tolpygo

Andy Szuromi

Jim Ohm

Gregory Weaver

Jack Saunders

Randal Easterwood

The disclosed embodiments generally relate to non-destructive evaluation methods. In an embodiment, a method for non-destructive evaluation of a aerospace component includes positioning a first plurality of sensors in the region of interest, positioning a second plurality of sensors in the region of interest, inducing a vibration in the region of interest using the first plurality of sensors and receiving a resonance frequency spectra using the second plurality of sensors, and comparing the received resonance frequency spectra against a reference spectra to determine the presence of an anomaly in the region of interest.

Non-destructive evaluation methods for aerospace components

A welding system is provided for welding a first work piece to a second work piece at a joint having a weld face and a root face. The welding system includes a weld face sensor configured to determine first joint characteristics at the weld face; a root face sensor configured to determine second joint characteristics at the root face; a controller coupled to the weld face sensor and the root face sensor and configured to generate positioning signals based on the first joint characteristics and the second joint characteristics; and a welding gun coupled to the controller and positioned proximate to the weld face, the welding gun configured to generate a welding beam for welding the joint based on the positioning signals from the controller.

Welding systems and methods

Embodiments of methods and systems for inspecting a structure for a crystallographic imperfection are provided. In the method, an X-ray wavelength that is particularly susceptible to diffraction by the crystallographic imperfection is identified. Then an X-ray source is provided to emit X-rays in the identified X-ray wavelength. While placing the structure at a sequence of positions relative to the X-ray source, X-rays are directed at the structure in multiple, non-parallel arrays to create sequential patterns of diffracted X-rays. The patterns of diffracted X-rays are digitally captured and communicated to a computer that compares them to locate the crystallographic imperfection. For a surface imperfection, the imperfection may be marked with a target to allow for physical removal.

Methods and systems for inspecting structures for crystallographic imperfections

Growing community of inventors

Chandler, AZ, United States of America

Andy Kinney