Samsung Electronics Co., Ltd.

Andrii Sukhariev

Kostiantyn Morozov

Dmytro Vavdiiuk

Oleksandr Klimenkov

Andrii But

Ivan Safonov

Ruslan Iermolenko

Yaroslav Lavrenyuk

Serhii Iliukhin

Jung-Kee Lee

Yong-Chan Keh

Sun-Kyung Kim

Iegor Vdovychenko

Sung-Soon Kim

Konstantin Morozov

Andrii Volochniuk

Oleksandr Sapozhnik

Dmytro Korba

Volodymyr Savin

Dmytro Vavdiyuk

An electronic apparatus is provided. The electronic apparatus includes a camera, a memory in which a plurality of captured images obtained through the camera and a parameter value of the camera are stored, and a processor electrically connected to the camera and the memory. The processor is configured to identify a scene type corresponding to each captured image of the plurality of captured images; extract a feature point of each captured image of the plurality of captured images based on a feature point extraction method corresponding to the identified scene type of each captured image; obtain a calibration parameter value corresponding to a feature type of each extracted feature point; obtain an integrated calibration parameter value based on one or more obtained calibration parameter values; and update the parameter value stored in the memory based on the integrated calibration parameter value.

Electronic apparatus and controlling method thereof

A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.

Three-dimensional depth measuring device and method

A synchronization method of a first depth sensing apparatus includes: transmitting a first optical signal to measure a distance to an object; receiving the first optical signal reflected by the object; when recognition of the received first optical signal fails, stopping transmission of the first optical signal and generating first synchronization information for synchronization with at least one second depth sensing apparatus; receiving a third optical signal for synchronization with the first depth sensing apparatus, which is transmitted by the at least one second depth sensing apparatus, and decoding the received third optical signal to extract at least one piece of second synchronization information; determining a time point at which and a cycle in which to re-transmit the first optical signal, based on the first synchronization information and the at least one piece of second synchronization information; and re-transmitting the first optical signal at the determined time point and cycle.

Depth sensing apparatus and operating method of depth sensing apparatus

An apparatus and method are provided and include an interface unit configured to receive an electrical signal based on light received from a camera; and at least one processor configured to obtain depth information of a scene based on the electrical signal received from the interface unit, wherein the at least one processor is configured to identify a recognition pattern corresponding to the light received by the camera based on the electrical signal, to obtain a total distance value between properties of a partial source pattern corresponding to a target fragment in the source pattern and properties of a partial recognition pattern corresponding to the target fragment in the recognition pattern, and to estimate depth information of the target fragment based on the obtained total distance value.

Apparatus and method for encoding in structured depth camera system

A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.

Method and apparatus for processing image

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Kyiv, Ukraine

Andrii Sukhariev