International Business Machines Corporation

Andrew T Holle

David Lewis Gardell

Jody John Van Horn

Dennis R Conti

James M Crafts

Harold Wayne Chase

Adrian Patrascu

Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.

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Austin, TX, United States of America

Andrew T Holle