The Mathworks, Inc.

Andrew T Campbell

David M Saxe

Gregory V Aloe

David Hruska

David A Foti

Joseph R Bienkowski

Gerhard P Stoeckel

John E Booker

Richard M McKeever

Santosh C Kasula

Ajay B Puvvala

Jeremy B Nersasian

A device may provide, via a code editor window of a user interface, program code that includes a reference. The reference may call a portion of program code. The portion of program code may be associated with a source of the portion of program code. The device may determine the portion of program code based on the reference. The device may provide the portion of program code, in-line with the program code, via the code editor window of the user interface. The device may receive a modification to the portion of program code via the code editor window of the user interface. The device may synchronize the modification to the portion of program code with the source of the portion of program code. The device may create a modified copy of the source of the portion of program code based on the synchronizing.

In-line function synchronization

A device receives code generated via a technical computing environment (TCE), the code including a value to be tested, and receives a value modifier, a test case, and a constraint. The value modifier customizes a manner in which the value of the code is presented to the constraint for verification. The device also generates a test based on the value modifier, the test case, and the constraint, performs the test on the value of the code to generate a result, and outputs or stores the result.

Modifiers that customize presentation of tested values to constraints

A device receives test methods that include input arguments that match parameters. The test methods are used to test one or more portions of dynamically-type programming code, and the parameters define conditions for the test methods. The device receives one or more values for each of the parameters, and applies the parameters and the one or more values to different ones of the test methods. The device executes the different ones of the test methods, with the applied parameters and the applied one or more values, to generate results, and outputs or stores the results.

Combination and reuse of parameters in an automated test environment

A device receives a first result that includes first data, and a second result that includes second data, and determines whether a comparator supports the first data and the second data. When the comparator supports the first data and the second data, the device utilizes the comparator to select comparison logic for the first data of the first result and for the second data of the second result, compares the first result and the second result, using the selected comparison logic, to determine whether the first result is equivalent to the second result, and outputs or stores the determination of whether the first result is equivalent to the second result.

Mechanism for comparison of disparate data in data structures

A device receives a first test class associated with a first fixture. The first test class includes first method(s) to test portion(s) of dynamically-type programming code, and the first fixture defines first environment(s) for the first method(s). The device receives a second test class associated with the first fixture and a second fixture. The second test class includes second method(s) to test the code portion(s). The first fixture defines the first environment(s) for the second method(s), and the second fixture defines second environment(s) for the second method(s). The device combines the first method(s) of the first test class and the second method(s) of the second test class to create a test group, and analyzes the test group to determine whether the test group is correctly organized based on the first fixture and the second fixture. The device provides a reorganized test group when the test group is incorrectly organized.

Efficient sharing of test fixtures and ordering of test suites

A device receives code generated via a technical computing environment (TCE), performs a test on the code to generate a test result, and generates test information based on the performance of the test on the code. The device outputs or stores the test result, and receives, based on the test result, a request for a diagnostic analysis of the code. The device performs, based on the request, the test information, and at least one diagnostic, a diagnostic analysis of the code to generate a diagnostic result, and outputs or stores the diagnostic result.

Deferred evaluation and presentation of a custom diagnostic analysis

A device receives code generated via a technical computing environment (TCE), where the code includes one or more values to be tested. The device receives Boolean constraints and diagnostic information, and generates a test based on the Boolean constraints and the diagnostic information. The device performs the test on the one or more values of the code to generate a result, and outputs or stores the result.

Integrating diagnostic information with boolean constraints

A computing device may obtain usage information relating to an execution of a function within code. The usage information may include a set of input values and an output value obtained based on executing the function using the set of input values. The computing device may further determine that the function has been executed a particular quantity of times using the set of input values and obtaining the output value, and may generate a unit test, for the function, based on determining that the function has been executed the particular quantity of times using the set of input values and obtaining the output value.

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Medway, MA, United States of America

Andrew T Campbell