Nikon Corporation

Intuitive Surgical Operations, Inc.

Nanometrics Inc.

Nikon Corporation of Japan

Andrew J Hazelton

W Thomas Novak

Douglas C Watson

Michael R Sogard

Michael B Binnard

Mike Binnard

Keiichi Tanaka

Jean-Marc Gery

Derek Coon

Kazuya Ono

Bausan Yuan

Hiroaki Takaiwa

Akimitsu Ebihara

Alton Hugh Phillips

Ken George Wasson

John K Eaton

Ian E McDowall

Theodore W Rogers

Randall L Schlesinger

Martin E Lee

Mark K Takita

Yutaka Hayashi

Andrew Saul Klassen

Hidemi Kawai

Thomas Novak

Lucas S Gordon

Nobukazu Ito

Jason Shields

Candice Murray

Shigeki Kageyama

Gabor D Szoboszlay

Andrew H Barada

Chuan Sheng Tu

Ed Reynolds

Hidehiro Chida

John Peterson

Nir Ben Moshe

Robert Martinek

Doug Watson

Yoichi Arai

Kirk Lok

Debjit Mukerji

Todd M Petit

Thomas W Novak

Thomas W Nowak

Systems and methods for image detection during grasping and stapling include an end effector having a first jaw and a second jaw, an imaging sensor mounted to the end effector and configured to capture images of a material graspable by the end effector, and one or more processors coupled to the end effector and the imaging sensor. The one or more processors are configured to receive the images from the imaging sensor, determine one or more properties of the material based on the images, and display the one or more properties of the material on an interface. In some embodiments, the end effector is part of a medical tool and the material is anatomical tissue. In some embodiments, the end effector further includes one or more of a stapling mechanism configured to staple the material or a cutting mechanism configured to cut the material.

System and method for image detection during instrument grasping and stapling

An imaging instrument comprises an elongate flexible shaft, a camera disposed at a distal end of the elongate flexible shaft, and a housing coupled to a proximal end of the elongate flexible shaft. The instrument also includes a light emitting diode (LED) within the housing and a heat dissipation system in thermal communication with the LED to transfer heat produced by the LED away from the housing.

Imaging systems and methods of use

An immersion lithography apparatus includes a projection system having a last optical element, a plurality of liquid supply openings that surround a path of exposure light that exits an end surface of the last optical element and face downwardly, and a plurality of liquid recovery openings that surround the path of the exposure light, are arranged radially outward of the liquid supply openings, and face downwardly. An upper surface of a substrate is opposite to the liquid supply openings and the liquid recovery openings. A portion of the upper surface of the substrate is covered with immersion liquid, which flows across the end surface of the last optical element. The substrate is exposed with the exposure light through the immersion liquid between the end surface of the last optical element and the upper surface the substrate.

Liquid jet and recovery system for immersion lithography

An integrated metrology module includes a chuck for holding a sample and positioning the sample with respect to an optical metrology device, a reference chip for the optical metrology device, the reference chip being movable to various positions with respect to the optical metrology device, and a reference chip purge device provides a flow of purge gas or air over the reference chip while the reference chip is in the various positions. The reference chip purge device may be static or movable with the reference chip.

Optical metrology with purged reference chip

A lithographic projection apparatus includes a projection system and a liquid confinement member extending along a boundary of a space under the projection system. The liquid confinement member has (i) a first opening facing downwardly via which a liquid is removed from a gap to be formed under the liquid confinement member, and (ii) a second opening facing downwardly via which fluid is removed from the gap to be formed under the liquid confinement member, the second opening being located radially outward of the first opening with respect to the space. The liquid in the space covers a portion of an upper surface of a substrate and the substrate is exposed through the liquid in the space.

Environmental system including vacuum scavenge for an immersion lithography apparatus

A cover plate or lens for an optical metrology device that is positioned under a wafer during measurement is protected with a purge device. The purge device may include a ring that extends around a periphery of the cover plate or lens. The ring includes a plurality of apertures through which a purge gas or air is expelled over the surface of the cover plate or lens. Additionally or alternatively, one or more heating elements may be provided that extend around the periphery of the cover plate or lens. The heating elements heat the cover plate above a dewpoint temperature of contaminant vapor. A heat sensor may be used to monitor the temperature of the cover plate to control the heating elements and/or to compensate for optical changes of the cover plate caused by heating during measurement of a wafer.

Protected lens cover plate for an optical metrology device

An immersion lithography apparatus includes an optical assembly including an optical element, and configured to project a beam onto a substrate through immersion liquid, a containment member surrounding a path of the beam, a stage on which the substrate is held and moved below a bottom surface of the containment member with the substrate spaced from the bottom surface of the containment member, and a support system having an actuator to support and move the containment member. The containment member includes a first supply opening via which water as the immersion liquid is released, a recovery opening via which the immersion liquid is recovered from a gap between the containment member and the substrate and/or the stage, and a second supply opening via which the water is released to the gap, the second supply opening being provided radially inward of the recovery opening.

Environmental system including a transport region for an immersion lithography apparatus

A liquid immersion lithography apparatus includes a projection system including an optical member of which an incidence side has a convex lens shape, the projection system being configured to project an image through a liquid on a workpiece, and a liquid immersion member arranged below the optical member, the liquid immersion member having a plurality of openings through which the liquid is allowed to flow. A material of which the optical member is made is more resistant to the liquid than a material of which the liquid immersion member is made.

A liquid immersion lithography apparatus includes an optical assembly having a last optical element, a first outlet facing downward, via which an immersion liquid is released, a first inlet via which the immersion liquid is drawn, and a containment member arranged to surround a last portion of the optical assembly. The containment member has (i) a second inlet facing downward, which is arranged radially-outwardly from the first outlet with respect to a space under the last optical element and via which fluid is removed from a gap formed under the containment member, and (ii) a second outlet facing downward, via which gas is supplied to the gap formed under the containment member, the second outlet being arranged radially-outwardly from the second inlet with respect to the space.

An immersion lithography apparatus includes an optical assembly that projects a beam onto a substrate through an immersion liquid, a containment member surrounding a path of the beam, a stage holding the substrate, an isolator having a first actuator which limits vibrations of the optical assembly, and a support system having a second actuator to support the containment member and move it by the second actuator. The containment member includes a first supply opening via which water as the immersion liquid is released, a recovery opening via which the immersion liquid is recovered from a gap between the containment member and the substrate and/or the stage, and a second supply opening via which the water is released to the gap between the containment member and the substrate and/or the stage, the second supply opening being provided radially inward of the recovery opening.

An immersion lithography apparatus includes an optical member, a gap defined between the optical member and a surface disposed opposite the optical member being filled with an immersion liquid, and a fluid control device including gas outlets through which a gas is supplied to prevent the immersion liquid from entering a surround area external to an exposure area. A flow velocity of the gas supplied from the gas outlets is controlled so that a pressure of the gas supplied by a first one of the gas outlets is different from a pressure of the gas simultaneously supplied from a second one of the gas outlets.

Immersion lithography fluid control system regulating flow velocity of gas based on position of gas outlets

A liquid immersion lithography apparatus includes a projection system, an opening from which liquid is supplied to a space under the projection system, the opening being connectable to a liquid source via a flow passage to supply the liquid to the space and the opening being connectable to a vacuum source via the flow passage, and a holding member by which a substrate is held, the holding member being movable below the projection system and the opening. The substrate held by the holding member is exposed through the liquid that is supplied from the opening and that covers only a portion of an upper surface of the substrate.

An immersion lithography apparatus includes (i) an optical assembly including an optical element, and configured to project a beam onto a substrate through an immersion liquid; (ii) a containment member that surrounds a path of the beam; and (iii) a stage on which the substrate is held, the substrate on the stage being moved below and spaced from a bottom surface of the containment member. The containment member includes: (1) a nozzle outlet via which water as the immersion liquid is released, (2) a recovery channel via which the immersion liquid is recovered from a gap between the containment member and the substrate and/or the stage, and (3) a fluid channel via which water is released to the gap between the containment member and the substrate and/or the stage, the fluid channel being provided radially inward of the recovery channel.

A liquid immersion exposure apparatus includes an optical assembly having a final optical element, from which exposure light is projected through immersion liquid filling an optical path of the exposure light under the final optical element, a containment member surrounding a tip portion of the optical assembly, and a movable stage to hold a substrate and having an upper surface around the held substrate. An apparatus frame supports the optical assembly and the containment member, and an optical mount isolator, which has an actuator, isolates the optical assembly from vibrations of the apparatus frame. A first inlet of the containment member faces at least one of the substrate and the stage and collects fluid from a gap between the containment member and the at least one of the substrate and the stage. A gas supply outlet of the containment member supplies gas to the gap.

A liquid immersion lithography apparatus exposes a wafer through a liquid in a space under a lens. The apparatus includes a containment member provided such that the containment member surrounds the space under the lens, and a seal member provided between the lens and the containment member. The containment member has a first fluid inlet. The first fluid inlet removes fluid from a gap between the containment member and the wafer during the exposure.

Growing community of inventors

Tokyo, Japan

Andrew J Hazelton