Nxp Usa, Inc.

Andrew H Payne

Colin MacDonald

Jose A Lyon

Alexander Hoefler

Chris P Nappi

A scan circuit and methods of operating a scan circuit are provided. The method for operating a scan circuit includes providing a first scan flip-flop which includes an overwrite feature. With the overwrite feature enabled, a change in functional behavior of the first scan flip-flop occurs based on a control signal. The method may further include capturing data at a first input of the first scan flip-flop during a first state of the control signal and resetting captured data by using the overwrite feature during a first transition of the control signal. The method may further include forming a scan chain with one or more of the first scan flip-flops and one or more second scan flip-flops. The second scan flip-flops may include a similar overwrite feature, having the overwrite feature disabled.

Data processing system with built-in self-test and method therefor

An integrated circuit includes a plurality of state retention power gating (SRPG) flip-flops coupled in a first chain, wherein the first chain has a first scan input and a first scan output; a pseudo random pattern generator (PRPG) configured to generate test patterns in response to seeds; a multiplexer (MUX) coupled between the PRPG and the first scan input and coupled to receive a select signal; and response compression logic coupled to the first scan output and configured to generate a test signature in response to an output pattern provided at the first scan output. The MUX is configured to, when the select signal has a first value, couple a first output of the PRPG to the first scan input, and, when the select signal has a second value, couple an inversion of the first output of the PRPG to the first scan input.

Growing community of inventors

Austin, TX, United States of America

Andrew H Payne