Teseda Corporation

Andrew H Levy

Steven R Morris

David S Kellerman

Ajit M Limaye

A design for test focused tester has a single printed circuit board tester architecture. By focusing on design for test testing and eliminating functional testing, the design for test focused tester reduces or eliminates requirements for high speed, precision signal formatting and timing circuitry that require a multiple board architecture interconnected via a high speed backplane. The single board architecture places a vector sequencer and vector memory close to the device under test, which provides short, consistent signal paths to the device and eliminates the need for dead cycles and synchronization between tester boards.

Single board DFT integrated circuit tester

A scan test viewing and analysis tool for an integrated circuit tester provides inter-related views of scan tests on an integrated circuit device. The tool processes a test program specification, execution results and device definition to produce cross-referencing data, which the tool then uses to provide navigation links between correlated locations in a cyclized test view, procedural test program view, and views of signal vectors, scan state and scan vectors. The tool also provides a capability to edit the test program in the views.

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Aloha, OR, United States of America

Andrew H Levy