Nokia Technology Gmbh

Me-in Gmbh

Andres Richter

Gerd Reime

Stefan Grohmann

Jörg Lummerzheim

In a circuit arrangement for analyzing a clocked signal reflected from an object, particularly an optical signal, wherein at least one radiation emitter which, for providing the clocked signal, is connected to a clocking signal generator, and at least one radiation receiver which receives radiation pulses emitted by the radiation emitter and reflected from the object, and a comparator by which the output signal pulses of the radiation are compared with reference pulses whose amplitudes depend on output signals of the comparator, are provided, the reference signal pulses occur concurrently with the radiation impulses received by the radiation receiver and the impulses received by the radiation receiver are compensated for each by a respective internal reference impulse before their analysis in the circuit arrangement.

Circuit for analyzing a signal reflected from an object

A variable electronic resistor (16), which can be varied by a control signal (Ust) at the control input (15), contains two parallel, signal paths (1 and 2) with identical components, of which one signal path carries a phase inverted input transmission signal and the other signal path carries a non phase inverted input transmission signal and which are additively joined at the output side. Each signal path contains a charge carrier channel (3) and a signal transmission stage (7) with a low impedance current input, located downstream of the output electrode (5) in the signal path of the charge carrier channel. The resistor of the charge carrier channel can be varied by a control voltage (Ust), which is common to both charge carrier channels, in a control electrode (14) of the semiconductor components (4).

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Pforzheim, Germany

Andres Richter