Robert Boschgmbh

Andrej Albrecht

Tobias Zibold

Markus Hahl

Juergen Winterhalter

Reiner Krapf

Christoph Wieland

Heiko Sgarz

Jan-Michael Brosi

Oliver Grossmann

Frank Huembert

A method for locating an object hidden beneath a surface using a locating device is disclosed. At least one coupling signal dependent on the object is received by a receiving means of the locating device. Once the locating device has been placed on the surface, a first value Ci of the coupling signal is detected and the first value Ci is defined as value CBG for a background subtraction. In particular, whilst the locating device and the surface are moved relative to one another, at least one further value C of the coupling signal is detected and the value CBG for the background subtraction is re-calibrated by the at least one further value C if the at least one further value C is lower than the value CBG for the background subtraction. The re-calibration is suspended if a valid value CBG is identified for the background subtraction.

Method for locating, and locating device

A sensor for locating metal or magnetic objects includes a first and a second transmitting coil and one receiving coil. The receiving coil includes a first and a second receiving sub-coil. The first transmitting coil and the first receiving sub-coil are arranged in a first plane. The second transmitting coil and the second receiving sub-coil are arranged in a second plane. The first transmitting coil and the first receiving sub-coil are offset in relation to the second transmitting coil and the second receiving sub-coil with respect to a common center axis which passes vertically through the planes. The first receiving sub-coil is configured differently than the second receiving sub-coil.

Sensor having rotationally offset coil pairs and differently formed receiving coils for locating metal or magnetic objects

A sensor for locating metallic or magnetizable objects comprises two emission coils and a receiving coil which are inductively interconnected. A method for determining the influence of temperature on the sensor includes supplying a first pair of predetermined alternating currents to the emitter coils, and simultaneously sampling current flows which pass through the emitter coils and a first current of the receiver coil. Subsequently, the method includes supplying a second pair of predetermined alternating currents to the emitter coils, and simultaneously sampling current flows which pass through the emitter coils and a second current of the receiver coil. The method further includes determining coupling factors between the emitter coils and the receiver coils based on the determined current flows and voltages, and determining the object based on the coupling factors.

Object locater and method for locating a metallic and/or magnetizable object

A locating device includes an AC voltage locating apparatus. The AC voltage locating apparatus has a first receiving apparatus configured to receive a first coupling signal from a locatable object. The AC voltage locating apparatus also has at least a second receiving apparatus configured to receive at least a second coupling signal from the locatable object. The AC voltage locating apparatus also has at least a first amplifier circuit configured to amplify a difference of the first coupling signal relative to a reference signal in at least one operating. The AC voltage locating apparatus also has at least a second amplifier circuit configured to amplify a difference of the first coupling signal and the second coupling signal in at least one operating state.

Positioning device

A circuit having a first, second, and third capacitor. Capacitor plates of the capacitors are connected to a first circuit node. The circuit supplies a first time-dependent voltage to the first capacitor, a second time-dependent voltage to the second capacitor, and a third time-dependent voltage to the third capacitor. The first and second voltages are clocked in antiphase. The second and third voltages are clocked in phase. The circuit has an amplifier, a synchronous demodulator, and a comparator. Inputs of the amplifier are connected to the first circuit node and ground. The synchronous demodulator alternately applies an output signal of the amplifier to inputs of the comparator, synchronously with the clock frequency of the first voltage. The circuit generates a control value dependent on an output of the comparator. The circuit changes amplitudes of the first and third voltage and/or the second voltage dependent on the control value.

Beam detector with control circuit

A metal sensor includes a primary coil arranged in a first plane, a first compensation coil arranged in a second plane, a second compensation coil arranged in a third plane, and a magnetic field sensor arranged in a fourth plane. The first plane, the second plane, the third plane and the fourth plane are oriented parallel to one another and perpendicular to a common z-direction in each case.

Metal sensor

A positioning device for capacitively detecting an object enclosed in a medium includes a measuring electrode, a receiving electrode, and a reference capacitance. The measuring electrode and the receiving electrode form a measuring capacitance that can be influenced by the object and the reference capacitance cannot be influenced by the object. The electrodes are disposed in a plane, and the device includes a spacer that is configured to keep the electrodes at a predetermined minimum distance from the surface of the medium. The predetermined minimum distance is different from zero.

Capacitive positioning device

A positioning device for capacitively detecting an object enclosed in a medium includes a measuring electrode, a reference electrode, and a receiving electrode. The measuring electrode with the receiving electrode forms a measuring capacitance, which can be influenced by the object. The reference electrode with the receiving electrode forms a reference capacitance, which cannot be influenced by the object. The positioning device further includes an oscillator configured to supply the measuring capacitance and the reference capacitance with phase-shifted AC voltages and a control device configured to control amplitudes of at least one of the AC voltages, in order to adapt effects of electrical fields of the measuring electrode or of the reference electrode on the receiving electrode to one another. The measuring, reference, and receiving electrodes are planarly formed. The measuring electrode has a larger surface area than the reference electrode.

A locating appliance for a capacitive detection of an object encloses in a medium. The locating appliance comprises a measurement electrode such that a first alternating current flows from the measurement electrode into the medium. The locating appliance further comprises a reception electrode where the measurement electrode forms a measurement capacitance with the reception electrode, where the measurement capacitance is based at least in part on the object. The locating appliance further comprises a reference electrode such that the reference electrode forms a reference capacitance with the reception electrode, where the reference capacitance is not based on the object. The locating appliance further comprises a first opposing electrode that is configured to introduce a first alternating current in the medium. The absolute value of the second alternating current corresponds to an absolute value of the first alternating current and is in antiphase with the second alternating current.

Capacitive locating appliance having opposing electrodes

A locator for capacitively sensing an object includes a transmission electrode to which an excitation signal can be applied, a reception electrode, a sensing region in the region of the transmission electrode and the reception electrode, and a measuring device for sensing a capacitance between the transmission electrode and the reception electrode. The locator further includes a processing device for determining the presence of the object in the sensing region if the sensed capacitance differs from a reference capacitance, and a screening electrode that is arranged in the region of the transmission electrode and the reception electrode. The screening electrode is connected to a potential so as to reduce the base capacitance between the transmission electrode and the reception electrode.

Locator

A measuring device for detecting a conductor that carries alternating voltage, includes a voltage source configured to produce two phase-shifted alternating voltages, two complex impedance elements having first connections, which are connected to the alternating voltages, and second connections, which are connected to each other and to which a differential voltage is applied, and a control device configured to control the alternating voltages in such a way that a component of the differential voltage synchronous with the alternating voltages is minimized in magnitude. The control device is configured to detect the conductor if a ratio of the alternating voltages does not correspond to a ratio of the complex impedance elements in the absence of the conductor. The second complex impedance element is changeable with a control voltage. A probe is configured to provide the control voltage as a function of an alternating electromagnetic field induced by the conductor.

Cable detector

A measuring apparatus for detecting a dielectric object comprises a potential probe for determining an electric potential in an electric field, a first capacitance device, a second capacitance device, and a control device configured to supply alternating voltages to the first and the second capacitance devices. The control device is configured to amplify the alternating voltages in opposite directions to one another in order to minimize the magnitude of an AC voltage component, which is clock-synchronous with the alternating voltages, of a voltage which is recorded by means of the potential probe. The dielectric object is detected when a ratio of the alternating voltages does not correspond to a ratio of (i) a first distance of the potential probe from the first capacitance device to (ii) a second distance of the potential probe from the second capacitance device.

Detection of a dielectric object

A measuring device configured to detect a metal object includes two emission coils configured to produce superimposed magnetic fields. The measuring device also includes a device configured to determine a differential voltage between the emission coils. The measuring device further includes a control device configured to supply the emission coils with alternating voltages such that the value of an AC voltage component of the differential voltage, which is time synchronized with the alternating voltage, is minimized. The control device is configured to detect the metal object when the ratio of the alternating voltages does not correspond to the ratio of the impedances of the emission coils when the metal object is not there.

Detection of a metal or magnetic object

A measuring device for detecting a metal object includes two emission coils configured to produce superimposed magnetic fields, a receiving coil in the region of both magnetic fields, and a control device configured to control the emission coils such that a value of a voltage, which is clock synchronized with alternating voltages and which is induced in the emission coils, is minimized. The control device is configured to detect the metal object when a ratio of the alternating voltages does not correspond to a ratio of distances between the receiving coils and the emission coils.

A stud detector has a voltage source, a first device, and a second device. The first device serves to generate a voltage that is galvanically decoupled from the voltage source. The second device serves for the potential-free transmission of a control signal.

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Stuttgart, Germany

Andrej Albrecht