Southwest Sciences, Inc.

University of Connecticut

Andrei B Vakhtin

Kristen A Peterson

Daniel James Kane

Eric H Jordan

Sina Shahbazmohamadi

Elias P Rosen

A method for evaluating the condition of a ceramic coating deposited on a substrate comprising illuminating the ceramic coating with light, measuring the intensity of light returned from the ceramic coating as function of depth in the coating and transverse position on the coating, and analyzing the measured light intensities to obtain one or more of intensity of the light returned from the exposed coating surface relative to the intensity of light returned from the coating/substrate interface, intensity of the light returned from the coating/substrate interface relative to the intensity of light returned from the bulk of the ceramic coating, determination of roughness at the exposed surface of the ceramic coating, and determination of roughness of the interface between the ceramic coating and underlying bond coat or substrate.

Method for non-destructive evaluation of ceramic coatings

An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real-valued interferograms to obtain the complex spectral interferogram.

Method and apparatus for full phase interferometry

An apparatus and method for spectral interferometry comprising providing an interferometer comprising a light source and dithering an element to provide a continuous relative phase shift between target and reference arms of the interferometer.

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Los Alamos, NM, United States of America

Andrei B Vakhtin