Rohde and Schwarz Gmbh & Co. Kg

Andreas Ziegler

Roland Krimmer

Martin Peschke

Andrew Schaefer

Alexander Kunze

Thomas Kuhwald

Stefan Ketzer

Reiner Franke

Dirk Gehrke

Franz Strasser

Michael Grimm

Sebastian Petzsch

Mirko Soellner

Detlef Schlager

Jens Naumann

Gottfried Czech

The present disclosure provides a circuit board arrangement comprising a main board comprising at least one longitudinal cutout, at least one reinforcing plate arranged in the at least one longitudinal cutout and mechanically coupled to the main board, wherein the plane of main extension of the main board is arranged perpendicular to the plane of main extension of the at least one reinforcing plate. Further, the present disclosure provides a differential probe circuit and a respective method.

Circuit board arrangement, differential probe circuit and method

The present disclosure provides a probe cable assembly comprising a probe interface configured to couple to a measurement interface and to receive a differential signal, a measurement output interface configured to output the differential signal, and a cable arrangement electrically arranged between the probe interface and the measurement output interface and configured to conduct the differential signal between the probe interface and the measurement output interface, the cable arrangement comprising a cable, a plurality of magnetic elements arranged around at least a section of the length of the cable, wherein each magnetic element is separated by a gap from adjacent magnetic elements, and a plastically deformable guiding element configured to fix the cable arrangement with a predetermined relative position between the probe interface and the measurement output interface.

Probe cable assembly and method

The present disclosure provides a main measurement device for simultaneously measuring signals with at least one secondary measurement device, the main measurement device comprising a reference signal output port configured to couple to the at least one secondary measurement device, a reference signal generator coupled to the reference signal output port and configured to generate a reference signal, a measurement port configured to receive a signal to be measured, a trigger output port configured to couple to a trigger input port of the at least one secondary measurement device and to output a trigger signal, and a controllably switchable internal signal path configured to selectively couple the reference signal generator with the measurement port. Further, the present invention discloses a respective secondary measurement device, a respective measurement system, and a respective method.

Main measurement device, secondary measurement device, measurement system and method

The invention relates to a power-over-fiber (PoF) system, comprising: an optical source configured to generate an optical signal, wherein the optical signal comprises an intensity modulation; an optical fiber configured to receive the optical signal from the optical source and to guide the optical signal; an optical sink, which is configured to receive the optical signal from the optical fiber and to convert the optical signal into an electrical signal; a detection unit, which is configured to detect at least one characteristic of the electrical signal, wherein the characteristic is at least partially caused by the intensity modulation of the optical signal; and a control unit, which is configured to control the optical source based on the detected characteristic.

Power-over-fiber system and method for operating a power-over-fiber system

The present disclosure provides a circuitry distortion corrector for correcting distortions of electrical signals. The circuitry distortion corrector comprises a first correction filter that filters the received signals, and a second correction filter that is coupled to the first correction filter and filters the signals that are filtered by the first correction filter. The first correction filter operates based on first filter coefficients that are based on first value tuples, each first value tuple comprising a first frequency and a respective first circuitry characterizing value, and wherein the first frequencies are equally spaced apart, and the second correction filter operates with second filter coefficients that are based on second value tuples, each second value tuple comprising a second frequency and a respective second circuitry characterizing value, wherein the second frequencies are logarithmically spaced apart.

Circuitry distortion corrector, measurement device, correction data generator, and correction method

The present invention provides an electrically isolated acquisition of a measurement signal by means of a measurement probe. For this purpose, a probe arrangement is provided with a probe head for electrically measuring a signal. The probe head is coupled to a probe coupler via optical links. In particular, optical links are used for power supply of the probe head and for forwarding optical signals corresponding to the measured electrical signal.

Probe head, probe coupler and probe arrangement

A signal correction method for correcting a measured signal has the following steps: processing a digital representation of a first signal at a first measurement input; processing a digital representation of a second signal at a second measurement input corresponding to the first signal convoluted with a transfer function; and determining the transfer function for correcting the measured signal. Further, a use of the method, a system for correcting a measured signal, and an oscilloscope are provided.

Signal correction method, system for correcting a measured signal, as well as oscilloscope

An electrical measurement system for performing a measurement on a device under test has a main unit, a probe unit connected to the main unit, a first offset generator for generating a first offset influencing the measurement, and a second offset generator for generating a second offset influencing the measurement. The first offset generator has a first analog step size and the second offset generator has a second analog step size. The first and second analog step sizes differ from one another.

Electrical measurement system and method for establishing a desired total offset

A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.

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Munich, Germany

Andreas Ziegler