Lumicks Ca Holding B.v.

Lumicks Dsm Holding B.v.

Stichting Vu

Andreas Sebastian Biebricher

Gijs Jan Lodewijk Wuite

Erwin Johannes Gerard Peterman

Iddo Heller

Anna Elisabeth Christina Meijering

Graeme Alan King

Andrea Candelli

Niels Laurens

One aspect of this disclosure relates to a computer-implemented method for determining a force acting on at least part of a structure, for example a biological structure, such as a DNA molecule. The method comprises controlling a light-sensitive system, e.g. of a microscope, to determine light information based on light from the structure. The light is incident on at least a part of the light sensitive system. The light-sensitive system may be said to capture the light from the structure. The at least part of the structure comprises one or more optically active entities, such as DNA intercalator molecules and donor/acceptor fluorophores. At least one of (i) an optical activity of the entities and (ii) a quantity of the entities depends on the force acting on the at least part of the structure. Furthermore, the light information defines a light property value associated with said at least part of the structure. The method further comprises determining the force acting on the at least part of the structure on the basis of said light property value and a reference light property value.

Method and system for optical force measurement

A method for determining a presence of at least one guest structure at a host structure. The method comprises a light-sensitive system receiving light from the host structure. The host structure hosts one or more optically active entities at at least one part of the host structure. The at least one part does not host the at least one guest structure. Furthermore, the optically active entities cause light emission from the at least one part. The method also comprises the light-sensitive system outputting a signal based on the received light a step of determining a light value based on the output signal. The light value indicates an amount of light from the host structure incident on the light-sensitive system. The method also comprises determining on the basis of the light value at least one of a quantity and a position of the at least one guest structure.

Methods and devices for determining a guest structure on a host structure

One aspect of this disclosure relates to a method for determining a presence of at least one guest structure at a host structure. The method comprises a light-sensitive system receiving light from the host structure. The host structure hosts one or more optically active entities at at least one part of the host structure. Herein, the at least one part does not host the at least one guest structure. Furthermore, the optically active entities cause light emission from said at least one part. The method also comprises the light-sensitive system outputting a signal based on the received light. The method further comprises determining a light value based on the output signal. The light value indicates an amount of light from the host structure being incident on the light-sensitive system. The method also comprises determining on the basis of the light value at least one of a quantity and a position of the at least one guest structure at the host structure.

The present disclosure relates to an apparatus () and method for controlling a plurality of simultaneously active optical traps (OT,OT,OT). In one method, trapping beams (TB,TB,TB) are provided and redirected for individually controlling a respective position (X,Y) of optical traps (OT,OT,OT) formed by focusing of the redirected trapping beams in a sample volume (SV). Light (L,L) from the sample volume (SV) corresponding to the optical traps is received. A path of a detector beam (AB) is overlapped with one of the trapping beams (TB), wherein the detector beam has a distinct wavelength (&#x3bb;A) from that of the overlapping trapping beam (TB). In one channel, the light from the sample volume is filtered according to wavelength, and only the filtered light having the wavelength (&#x3bb;A) of the detector beam (AB) is measured.

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Amsterdam, Netherlands

Andreas Sebastian Biebricher