Infineon Technologies Ag

Infineon Technologies LLC

Andreas Logisch

Wolfgang Ruf

Martin Schnell

Björn Flach

Michael Schittenhelm

Monica De Castro Martins

J&ouml;rg Stippler

Bj&ouml;rn Flach

Mónica De Castro Martins

Ana Leao

The invention provides a method for testing circuit units to be tested in a test apparatus, different identification units being assigned to the circuit units to be tested, the circuit units to be tested being connected to the test apparatus, a tester data stream including command blocks being output from the test apparatus, the tester data stream being compared with the identification units, the circuit unit to be tested, the identification unit of which matches the tester data stream output by the test apparatus, being activated and at least one command block for this circuit unit to be tested being processed in the circuit unit to be tested, whereupon the circuit unit to be tested is deactivated.

Circuit arrangement and method for driving electronic chips

An insertable calibration device for a programmable tester apparatus comprises at least one calibration unit and a control unit. The progammable tester apparatus is configured to test at least one electronic device with electronic circuits. The progammable tester apparatus comprises a holding device, contact-making devices for the electronic device, and tester channels for coupling in signals to the electronic device. The calibration unit is connected to a first tester channel to be calibrated. The calibration unit is configured to detect a calibration signal edge of a calibration signal that is transmitted by the tester apparatus at a certain transmission instant, to detect a reference signal edge of a reference signal that is transmitted by the tester apparatus via a second tester channel at a reference instant, to compare the instants at which the two signal edges arrive, and to output a comparison result. The control unit evaluates the comparison results and can be used to program the transmission instants in such a way that the instants at which the calibration signal edge and the reference signal edge arrive, for the compensation of signal propagation time differences, are substantially identical. The calibration device has the same form and connections as the electric device and is insertable into the holding device with an accurate fit instead of the electronic device.

Insertable calibration device

A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.

Semiconductor component, arrangement and method for characterizing a tester for semiconductor components

A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.

Method and magazine device for testing semiconductor devices

A test apparatus comprises an input for receiving a test signal from a test signal source, wherein a signal line with a predefined characteristic wave impedance can be connected to the input. The test apparatus further comprises branching means with a first and a plurality of second terminals, the first terminal being connected to the input. The test apparatus further comprises a plurality of distribution lines, wherein each distribution line is connected to one of the plurality of second terminals of branching means, wherein one of the devices under test can be connected to each distribution line at the output side, each distribution line having a characteristic wave impedance, which is substantially equal to the product of the predefined characteristic wave impedance of the signal line and the number of distribution lines. Thus, a signal matching is given at the branching point, so that no amplitude or signal rise time distortions of the excitation signals occur at the inputs of the devices under test.

Growing community of inventors

Munich, Germany

Andreas Logisch