Nxp B.v.

Nxp Usa, Inc.

Andreas Lentz

Jan-Peter Schat

Garima Sharda

Andreas Bernardus Maria Jansman

Stefan Doll

Amol Agarwal

Rohit Kumar Sinha

Vandana Sapra

Fabrice Poulard

Ulrich Moehlmann

Martin Heinrich Butkus

Stefan Heyse

Oliver Alexander Schmidt

An apparatus configured to: receive a digital input signal; receive a processing-direction-signal that can have a forward-value or a backward-value; and provide a digital output signal. The apparatus comprising a processor configured to apply an involutional cryptographic function to the digital input signal by: for a first operation: apply a first step of the involutional cryptographic function to the digital input signal in order to implement a forward calculation to move to the next step in the sequence; and perform a plurality of further operations until the forward calculation of a last step is performed. Each further operation comprises: if the processing-direction-signal has a forward-value: then perform the forward calculation for the current step; or if the processing-direction-signal has a backward-value: then perform a backward calculation for the current step.

Apparatus to cryptographically provide a digital output signal as a response to a challenge

A voltage glitch detector includes a ring oscillator, a plurality of counters, a combined result circuit, and a result evaluation circuit. The ring oscillator includes a plurality of series-connected stages. An output of a last stage of the ring oscillator is coupled to an input of a first stage of the ring oscillator. Each counter of the plurality of counters has an input coupled to a node located between two stages of the plurality of series-connected stages. The combined result circuit is coupled to each of the plurality of counters. The combined result circuit combines the count values received from each counter of the plurality of counters to provide a combined result. The result evaluation circuit is coupled to compare the combined result with a reference value to determine when a voltage glitch is detected.

Voltage glitch detection circuit

A method for clock frequency monitoring for a Phase-Locked Loop (PLL) based design includes determining a present operating point of an oscillator of the PLL based design, wherein the oscillator generates a present frequency in response to the present operating point. The present operating point of the oscillator is compared to a comparison range defined by a plurality of reference operating points, wherein the oscillator generates a nominal reference frequency in response to a nominal one of the plurality of reference operating points and the comparison range is further defined by a manufacturing process range, an operating voltage range and an operating temperature range. An action is performed in response to the present operating point being outside of the comparison range.

Clock frequency monitoring for a phase-locked loop based design

A glitch detector includes a metastability detector circuit, a reference storage circuit, and a pattern comparison circuit. The metastability detector circuit is configured to generate state signals at each cycle of the clock signal. The reference storage circuit is configured to store a logic state of each state signal based on a delayed version of the clock signal, and generate reference signals. A logic state of each reference signal is equal to a logic state of a corresponding state signal generated during a previous cycle of the clock signal. The pattern comparison circuit is configured to receive the state signals generated during a current cycle of the clock signal, the reference signals, and first and second values, and generate clock and voltage glitch signals based on first and second patterns that are associated with the state signals generated during the current cycle and the reference signals, respectively.

Glitch detector

A method for securing an integrated circuit chip includes obtaining a first value from a first storage area in the chip, obtaining a second value from a second storage area in the chip, generating a third value based on the first value and the second value, and converting a first opcode command obfuscated as a second opcode command into a non-obfuscated form of the first opcode command based on the third value. The first value corresponds to a physically unclonable function (PUF) of the chip. The second value is a key including information indicating a type of obfuscation performed to obfuscate the first opcode command as the second opcode command. The third value may be an inversion flag indicating a type of obfuscation performed to obfuscate the first opcode command as the second opcode command.

System and method for obfuscating opcode commands in a semiconductor device

An integrated circuit for hardware security comprises a voltage glitch detection processing system comprising an oscillator circuit that generates and outputs a local oscillator clock which is a function of a supply voltage; a counter clocked by the oscillator circuit to generate at least one count value; and a capture section that synchronizes the at least one count value into a system clock domain for detecting a voltage glitch in the supply voltage.

Voltage glitch detection in integrated circuit

A fully digital method and apparatus are provided for detecting glitches on a monitored line by providing a toggle signal to an initial delay circuit and a plurality of delay elements formed with standard logic cells so that logic values from the delay elements are captured in a corresponding plurality of clocked capture flops to provide a digitized representation of a delay value during a sampling period which is converted to a numerical measurement result which is evaluated against a reference value to generate an output error signal if a difference between the numerical measurement result and reference value exceeds a programmable margin, where the initial delay circuit is configured with a trim setting to impose an initial delay to compensate for process variations and where the reference value is adapted over a plurality of sampling periods to compensate for temperature effects on the numerical measurement result.

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Buchholz, Germany

Andreas Lentz