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Bruker Axs Gmbh

Incoatec Gmbh

Andreas Kleine

Carsten Michaelsen

Christoph Ollinger

Detlef Bahr

Juergen Graf

Josef Kreith

Nima Bashiry

Frank Hertlein

Jürgen Graf

A method for adjusting a primary side of an X-ray diffractometer wherein the primary side comprises a collimator, X-ray optics, an X-ray source, in particular an X-ray tube, wherein the collimator, the X-ray optics and the X-ray source are mounted directly or indirectly on a base structure, and wherein the orientation and position of the X-ray optics and the position of the X-ray source are adjusted relative to the base structure, wherein the method is characterized in that the orientation and position of the X-ray optics and the position of the X-ray tube relative to the base structure are measured and set at predetermined target values, so that with these set target values, X-ray radiation emanating from the X-ray source and conditioned by the X-ray optics is detectable at the output end of the collimator.

Method of adjusting the primary side of an X-ray diffractometer

An x-ray apparatus (), has an electron beam source (), a target (), onto which the electron beam () is directed to form a focal spot () on the target (), x-ray optics () for collecting x-rays emitted from the focal spot () to form an x-ray beam () and a sample position () at which the x-ray beam () is directed. The x-ray apparatus () further includes an electrostatic or electromagnetic electron beam deflection device () suitable for moving the focal spot () on the target (). The extension of the focal spot () in any direction (x, y, z) is at least a factor of 1.5 smaller than the extension of the target (). An x-ray apparatus is thereby provided with simplified alignment of the x-ray optics with respect to a microfocus x-ray source.

X-ray apparatus with deflectable electron beam

An X-ray analysis apparatus has at least one X-ray aperture () which delimits an X-ray beam (RS) emitted by an X-ray source (). The at least one X-ray aperture () is disposed at a separation from the sample () and has a single crystal aperture body () with a through pinhole (). The single crystal aperture body () forms a peripheral continuous edge () which delimits the X-ray beam (RS) and starting from which the pinhole () widens like a funnel in a direction of an outlet opening () of the X-ray aperture () in a first area (B). The X-ray analysis apparatus reduces impairment of X-ray measurements due to parasitic scattered radiation and at little expense.

X-ray analysis apparatus with single crystal X-ray aperture and method for manufacturing a single crystal X-ray aperture

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Hamburg, Germany

Andreas Kleine