Infineon Technologies Ag

Andreas Kalt

Martin Pernull

Franz Wachter

Peter Bogner

Jaafar Mejri

Bernhard Wotruba

Igor Ullmann

Gerhard Pichler

Devices for sampling a plurality of input signals are provided, wherein a sampling device is controlled to sample the input signals in a random order with additional delays. Other embodiments relate to voltage monitoring systems and corresponding methods.

Devices and methods for multi-channel sampling

High-voltage level-shifter architectures that provide galvanic coupling between low/high-voltage domains while simultaneously enabling high speed operation, low static current consumption and high reliability under a myriad of environmental circumstances including electromagnetic interference as well as process, voltage and temperature variations.

High-voltage level-shifter circuitry

Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.

Built-in self-test for ADC

Growing community of inventors

Treffen, Austria

Andreas Kalt