Freescale Semiconductor,inc.

Nxp Usa, Inc.

Other

Andreas Johann Roth

Hubert Martin Bode

Andreas Laudenbach

Engelbert Wittich

Stephan Lehmann

Kurt U Neugebauer

Mathieu Gauthier Lesbats

Martin Chrobaczek

Stefan G Luft

Helmut Denz

Hans Heim

A method and system are provided for digitally controlling a switch mode power supply without using analog-to-digital converters by providing an SMPS output in feedback to first and second comparators along with upper and lower reference voltage thresholds to detect excursion counts at dedicated counters which identify how many times an SMPS output voltage exceeds the upper and lower reference voltage thresholds during each cycle of a fixed frequency PWM signal, where the excursion counts are evaluated with a non-linear multi-step digital control loop detection sequence to generate duty cycle adjustment instructions for controlling each duty cycle of the fixed frequency PWM signal.

Digital control algorithm using only two target voltage thresholds for generating a pulse width modulated signal driving the gate of a power MOS to implement a switch mode power supply

A semiconductor device comprising a substrate and an electronic circuit thereon is described. The electronic circuit comprises a first voltage provider node, a second voltage provider node, and an intermediary node connected to the first and second voltage provider node by a first and second network with a first and second resistance, respectively. The substrate is susceptible to conducting a substrate current. The semiconductor device further comprises a substrate current sensor. The first network is arranged to reduce the first resistance in response to the substrate current sensor signaling an increase of the substrate current and vice versa. Similarly, the second network is arranged to reduce the second resistance in response to the substrate current sensor signaling an increase of the substrate current and vice versa. A method of operating a semiconductor device is also disclosed.

Semiconductor device and method of operating a semiconductor device

A semiconductor device comprises a substrate provided with a doping of a first type, on which an electronic circuit is provided surrounded by a circuit portion of the substrate provided with a doping of a second type; at least one pad for connecting the electronic circuit to an external device outside the substrate, surrounded by a pad portion provided with a doping of the second type; a sensing device comprising a sensor portion of the substrate provided with a doping of the first type, for sensing a parameter forming a measure for a local electrical potential of the substrate; and an evaluation unit connected to the sensing device, for providing an evaluation signal based on a difference between the parameter and a reference value.

Semiconductor device with appraisal circuitry

A semiconductor device includes a substrate on which an electronic circuit is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.

Semiconductor device and apparatus including semiconductor device

An integrated protection circuit for protecting a main circuit from spurious high amplitude voltage signals is provided, wherein the main circuit has a main circuit input terminal connected to an input line, and the protection circuit comprises a transistor, a resistor and a capacitor. The transistor has a first electrode connected to the input line, a second electrode connected to a common reference, and a control electrode connected to the resistor. The resistor is connected to the common reference; and the capacitor is implemented as a fringe capacitor between the input line and the control electrode or a conductive line connected to the control electrode.

Integrated protection circuit

A semiconductor device includes a substrate on which an electronic circuit is provided. Two or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an aggregate amount of a current flowing between the substrate and said pads. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter.

A circuit arrangement for detecting unwanted signals on a clock signal comprises an input for receiving the clock signal, and a Phase Lock Loop PLL circuit having a reference input coupled to the input of the circuit arrangement for receiving the clock signal and an output for providing a PLL output signal. The circuit arrangement further comprises a detector coupled to the output of the PLL circuit and to the input of the circuit arrangement. The detector is arranged to identify correct transitions in the clock signal using the PLL output signal, and to remove incorrect transitions due to unwanted signals from the clock signal so as to provide a filtered clock signal at an output of the circuit arrangement.

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Guenzenhausen, Germany

Andreas Johann Roth