The European Union, Represented by the European Commission

University of Pavia

Plasmore Srl

Andrea Valsesia

Pascal Colpo

François Rossi

Franco Marabelli

Cloé Desmet

Isaac Ojea Jimenez

Monica Quarato

Francesco Fumagalli

Jessica Ponti

Douglas Gilliland

Grigore Rischitor

Gerardo Marchesini

Silvia Giudicatti

Cloe Desmet

Francois Rossi

The present invention relates to a method for the detection of at least one nano or micro plastic particle comprised in a heterogeneous matrix material comprising the following steps: applying of at least one part of a heterogeneous matrix material comprising at least one nano or micro plastic particle onto at least a portion of a surface of a conductive support thereby forming a first layer onto said surface, irradiating of at least a portion of said first layer with at least one ion beam, thereby forming an irradiated layer, detecting of the at least one nano or micro plastic particle comprised in said irradiated layer by a detection method chosen from the group of Raman nanoscopic techniques, or infrared nanoscopic techniques, or charge dependent detection methods or combination thereof. The present invention allowed good detection of micro and nano plastic particles with high resolution and sensitivity.

Method for the detection and quantification of nano or micro plastic particles

A nanoparticle screening chip and a method using said chip allowing for determining physical properties of nanoparticles, wherein the screening chip comprises a substrate having a working surface divided into a plurality of areas, wherein (1) each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy &#x3b3;of the surface of each area being defined as follows: &#x3b3;=&#x3b3;+2(&#x3b3;&#x3b3;), wherein the components are: &#x3b3;=dispersive component=d, &#x3b3;=electron acceptor component=b, &#x3b3;=electron donor component=a; and (2) each of these areas comprises a plurality of subareas, each subarea comprising an array of sub-micrometric holes or elongated grooves with a different aperture size (S, S, S, . . . ).

Screening of nanoparticle properties

A sensor device comprises a dielectric substrate (); and a metal layer () on the substrate () with at least one array of cavities () therein and adapted to support L-SPR, each of the cavities () in the metal layer () having an opening () and a closed bottom () and widening from opening to bottom. A bed of dielectric material () is provided over the bottom () of each cavity () to reduce its apparent depth, the bed surface () being functionalized to bind to receptor moieties (). This sensor device is particularly designed for SPR detection, but can be used in other detection techniques.

SPR sensor device with nanostructure

A SPR sensing method comprising the steps of: providing a SPR sensor comprising a SPR supporting sensor surface and contacting a sample to be analysed with the sensor surface. At least one resonance condition at said SPR supporting sensor surface is monitored by illuminating the sensor surface with an SPR exciting test light beam and sensing the reflected or transmitted test light beam. Additionally, the sensor surface is illuminated with a reference light beam under conditions selected so as not to excite SPR at said sensor surface and sensing the intensity of the reflected or transmitted reference light beam. At least one property of the reflected or transmitted test light beam is determined taking into account the sensed intensity of the reflected or transmitted reference light beam.

Surface plasmon resonance sensing method and sensing system

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Ranco, Italy

Andrea Valsesia