Finisar Corporation

André Lalonde

James Kenneth Guenter

Jimmy Alan Tatum

Jack Gilkerson

R Stephen Speer

A system for detecting the lateral movement of thread includes an optical device configured to emit an optical signal. The optical device includes a resonant cavity. The system further includes a driver configured to drive the optical signal. A mechanical guide is configured to receive a moving thread that scatters the optical signal such that a portion of the optical signal is reflected back into the resonant cavity of the optical device; causing a change in the optical signal. An optical detector is configured to detect the changed optical signal. Lateral movement detection circuitry is configured to detect lateral movements such as vibrations.

Thread lateral movement sensor

Optical test apparatus. A test apparatus for testing transmitter or receiver devices. The test apparatus includes a transmitter source configured to connect to an optical transmitter. A wide band, wide area optical detector is adapted to optically couple to the optical transmitter powered by the transmitter source. A filter is connected to the optical detector. The filter is configured to separate AC and DC portions of a signal received from the optical detector. A true RMS converter is connected to the filter. The filter is configured to convert an AC noise signal received from the filter to a function of an RMS value of the AC noise signal received from the optical detector. A data acquisition system is connected to the true RMS converter. The data acquisition system is configured to characterize noise characteristics of the transmitter source.

High frequency noise measurement board

A test module for establishing a releasable electronic connection to at least one radially arranged electrical lead of an electronic component is disclosed. The test module can include an elongate housing having a distal end and a proximal end, and a set of pivotal contact clamps for establishing a releasable electrical connection to the leads of an electrical component located at the proximal end of the elongate housing. The leads of the electrical component are radially arranged about a center point of the electrical component and at least one lead is located at a different radial distance from the center point of the electrical component.

Optical package alignment and test module

AC and/or DC testing of an optoelectronic device at the wafer level. In one example embodiment, a method of testing one or more devices at a wafer level includes generating a test signal; supplying the test signal to a single device on a wafer; providing an output of the single device to each of a plurality of devices on the wafer by way of a common electrical connection between the single device and the plurality of devices; providing an output of each of the plurality of devices to a corresponding return connection by way of electrical connections between the plurality of devices and the plurality of return connections; and receiving return currents from each of the return connections.

Methods and apparatus for device testing at the wafer level

Methods for testing optical components, such as laser diodes or light emitting diodes, that are manufactured for use in optical transmitters or transceivers. The testing methods are performed using a true RMS conversion circuit in a test apparatus. The testing methods are performed by receiving an optical signal with AC and DC components from the optical component that is to be tested. The optical signal is converted to an electrical signal, and the AC and DC components of the electrical signal are separated. An RMS circuit of the test apparatus converts the AC component of the electrical signal to a DC function of the RMS value of the AC component of the electrical signal. This testing method can be used to determine whether optical components are suitable for use by customers or in products.

Methods for testing optical transmitter components

A method of performing eye safety measurements on laser devices is disclosed. The laser is contained within a housing having a central bore. The method uses an optical detector having at least two zones to make separate measurements of both a direct power coming from the laser and an indirect power reflected off of the central bore. The first zone measuring the direct power is smaller than the second zone measuring the indirect power. The measurement of the first power is then used to adjust the power of the laser to be within a specified optical standard, such as the class 1 standard. In one exemplary embodiment, the laser is an 850 nanometer Vertical Cavity Surface Emitting Laser (VCSEL).

Method for performing eye safety measurements on laser emitter devices

Electronically reset table test apparatus. The test apparatus includes an electronically operable current breaker connected to a test jig for testing semiconductor die. The electronically operable current breaker is connected through an interface that converts signals to signals appropriate for use on a computer bus to a computer system. The test apparatus can detect faults in the semiconductor die and open the electronically operable current breaker in response to detecting the fault. The electronically operable current breaker can be closed when the fault is removed.

Electronically resettable current protection for die testing

An apparatus for testing optical components. The apparatus includes a component cavity. The component cavity includes a package portion generally including fit tolerances but otherwise including a similar size and shape of an optical component to be tested. The component cavity further includes an electrical interface portion that can hold electrical interface leads of the optical component. The apparatus further includes an optical fiber interface optically connected to the cavity. The optical fiber interface mates with an optical fiber. The optical fiber is connected optically to the optical component being tested.

High frequency test fixture

An optical test apparatus. The test apparatus includes an optical source. A first optical switch is connected to the optical source. An attenuated responsivity test path may be selectively coupled to the first optical switch. A return loss test path may alternatively be selectively coupled to the first optical switch. A second optical switch may be selectively coupled to the attenuated responsivity test path or the return loss test path. An optical splitter is connected to the second optical switch. The optical splitter is configured to connect to a ROSA. A detector is connected to the optical splitter. The detector is configured to connect to a test meter.

Optical return loss measurement

Methods and apparatus for alignment of TO cans with photodiodes on fiber-optic receptacles. The methods and apparatus make use of direct connections to photodiodes or connections to Received Signal Strength Indicator (RSSI) outputs to align TO cans in fiber-optic receptacles. An optical source, such as a laser diode, can be powered by a low-frequency or DC source. This optical source can direct light into the fiber-optic receptacle. The TO can is manipulated in a barrel of the fiber-optic receptacle. The current through the photodiode or the RSSI output is monitored to determine when light directed into the photodiode is at a maximum or above a predetermined threshold. The TO can is fixed in the barrel when the light directed into the photodiode is at the maximum or predetermined threshold.

Rosa alignment using DC or low frequency optical source

A true RMS conversion circuit. A test apparatus includes a transmitter source including AC and DC supplies. The transmitter source can connect to a transmitter. The test apparatus includes an optical receiver to receive optical signals from a transmitter coupled to the transmitter source. The optical receiver includes an amplifier with a differential output. The test apparatus also includes a matching networks connected to a high and low outputs. Also included in the test apparatus are filters connected to the matching networks. The filters are designed to separate AC and DC signals. An RMS conversion circuit is connected to the filters such that the RMS conversion circuit receives AC signals from the filters. The RMS conversion circuit converts the AC signals to a DC function of the RMS value of the AC signals. A data acquisition system is connected to the RMS conversion circuit to receive the function of the RMS value of the AC signals. The data acquisition system is connected to the filters to receive DC signals from the filters.

Growing community of inventors

Allen, TX, United States of America

André Lalonde