Intel Corporation

Andal Jayalakshmi Ganapathy Ramalingam

Rita Chattopadhyay

Ravindra V Narkhede

Apparatus and method to facilitate automatic detection of a device state are disclosed herein. Selectively constraining a sensor based data set associated with one or more states of a device, wherein selectively constraining the sensor based data set includes analyzing a distribution of the sensor based data set to determine whether to constrain the sensor based data set, the sensor based data set including a first class and a second class of data values. Determining a threshold associated with the sensor based data set by selecting the threshold based on a variance between the first and second classes of the sensor based data set, wherein selecting the threshold includes using a constrained sensor based data set when the sensor based data set is determined to be constrained, and wherein the threshold indicates the data values associated with the first and second classes.

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Penang, Malaysia

Andal Jayalakshmi Ganapathy Ramalingam