Thermo Fisher Scientific (bremen) Gmbh

Thermo Fisher Scientific Gmbh

Anastassios Giannakopulos

Alexander Alekseevich Makarov

Hamish Stewart

Christian Hock

Matthias Biel

Nicolaie Eugen Damoc

Alexander Kholomeev

Alexander Wagner

Christian Thoeing

Richard Heming

Christian Albrecht Hock

A mass spectrometer comprises: a first ion optical device in a relatively low gas pressure region; a second ion optical device in a relatively high gas pressure region, the first and second ion optical devices receiving respective RF voltages from respective RF power supplies for generating respective RF fields that confine ions in respective trapping regions of the ion optical devices; and a gas conductance restriction, restricting gas flow from the relatively high gas pressure region to the relatively low gas pressure region, the gas conductance restriction having an aperture to allow ions to pass from the second to the first ion optical device. The first and second RF power supplies are independent to allow the RF voltages for generating the first RF field to have a different amplitude from the RF voltages for generating the second RF field.

Ion transport between ion optical devices at different gas pressures

A method of mass spectrometry for analyzing a sample within a mass range of interest includes the steps: ionizing the sample to produce a plurality of precursor ions; performing an MS1 scan of the precursor ions comprising mass analyzing the precursor ions across the mass range of interest, to obtain an MS1 mass spectrum of the precursor ions; determining ion intensity values within the MS1 mass spectrum; selecting precursor mass segments within the mass range of interest, and for each precursor mass segment: fragmenting the precursor ions within that precursor mass segment; and performing an MS2 scan of the fragmented ions by: controlling an amount of fragmented ions for that precursor mass segment, based on an intensity value for that precursor mass segment derived from the MS1 spectrum; and mass analyzing the amount of fragmented ions.

Mass spectrometer and method of mass spectrometry

A method of determining one or more interference parameters for a particular peak of an isotopic distribution corresponding to a precursor molecule in MS scan data is provided. The MS scan data comprises a plurality of peaks. Each peak has a mass-to-charge ratio and a relative abundance. The isotopic distribution comprises a subset of the plurality of peaks. The one or more interference parameters comprises a peak purity, p, for the particular peak. The method comprises determining that there are no interfering peaks relevant to the isotopic distribution and determining that the peak purity, p, for the particular peak should be a maximum purity value. Alternatively, the method comprises identifying one or more interfering peaks from the MS scan data, wherein the one or more interfering peaks do not belong to the subset of peaks of the isotopic distribution, and determining the peak purity, p, for the particular peak based on: the relative abundance, I, of the particular peak, and the relative abundance of the one or more interfering peaks.

Methods and apparatus for determining interference in MS scan data, filtering ions and performing mass spectrometry analysis on a sample

Calibration of a mass spectrometer is described. In one aspect, a mass spectrometer can generate an offset value indicative of the mass difference between the corrected and reference external calibrant ion data. By comparing the offset value to a threshold, a preliminary mass calibration can be modified, or a recalibration of the mass spectrometer is performed.

Mass calibration of mass spectrometer

A data independent acquisition method of mass spectrometry for analyzing a sample within a mass range of interest as it elutes from a chromatography system. The method comprises selecting precursor ions within a mass range of interest to be analyzed, performing at least one MS1 scan of the precursor ions using a first, high-resolution mass analyzer and performing a set of MS2 scans by segmenting the precursor ions into a plurality of precursor mass segments, each precursor mass segment having a mass range of no greater than 5 amu, and for each precursor mass segment fragmenting the precursor ions within that precursor mass segment and performing an MS2 scan of the fragmented ions using a time of flight mass analyzer.

Hybrid mass spectrometer

A data independent acquisition method of mass spectrometry for analyzing a sample within a mass range of interest as it elutes from a chromatography system. The method comprises selecting precursor ions within a mass range of interest to be analyzed, performing at least one MS1 scan of the precursor ions using a Fourier Transform mass analyser and performing a set of MS2 scans by segmenting the precursor ions into a plurality of precursor mass segments, each precursor mass segment having a mass range of no greater than 5 amu, and for each precursor mass segment fragmenting the precursor ions within that precursor mass segment and performing an MS2 scan of the fragmented ions.

The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.

Data acquisition system and method for mass spectrometry

A technique for time interval measurement is provided. First and second signal components are received, sampled and digitized. The first signal component is derived from a trigger signal that causes or indicates generation 5 of the second signal component. A time interval between the first and second signal components is determined based on a reference time defined by the sampled and digitized first signal component and based on a reference time defined by the sampled and digitized second signal component.

Time interval measurement

A method of separating charged particles using an analyzer is provided, the method comprising: causing a beam of charged particles to fly through the analyzer and undergo within the analyzer at least one full oscillation in the direction of an analyzer axis (z) of the analyzer whilst orbiting about the axis (z) along a main flight path; constraining the arcuate divergence of the beam as it flies through the analyzer; and separating the charged particles according to their flight time. An analyzer for performing the method is also provided. At least one arcuate focusing lens is preferably used to constrain the divergence, which may comprise a pair of opposed electrodes located either side of the beam. An array of arcuate focusing lenses may be used which are located at substantially the same z coordinate, the arcuate focusing lenses in the array being spaced apart in the arcuate direction and the array extending at least partially around the z axis, thereby constraining the arcuate divergence of the beam a plurality of times as it flies through the analyzer.

Charged particle analysers and methods of separating charged particles

A multi reflection time of flight (MRTOF) mass spectrometer () And method for identifying a sample is disclosed. Sample ions are generated at an ion source (). The MRTOF is a closed mirror arrangement with first and second opposed ion mirrors (') on an axis of reflection (XX&#x2032;). The MRTOF () also includes a bidirectional ion deflector () on that axis (XX&#x2032;). The deflector () deflects ions onto the reflection axis as a short pulse at time to &#x3c;zero&#x3e; where they oscillate multiple times, separating in time of flight according to ion m/z. At a later time t, ions travelling in both directions along the axis (XX&#x2032;) are ejected out of the MRTOF () by the bidirectional deflector () to an ion detector arrangement (). The separation of ions in time of flight allows a 'fingerprint' of a biological sample to be produced by the detector arrangement () without the need to assign a mass to each peak. Comparison with a library of fingerprints permits identification.

Method of multi-reflecting timeof flight mass spectrometry with spectral peaks arranged in order of ion ejection from the mass spectrometer

A method and apparatus for high resolution separation of ions based on their high field and low-field mobility properties is described. An elongate ion separation channel is defined by a plurality of channel walls. First and second channel walls have first and second spaced ion separation electrode assemblies respectively. A power supply applies a periodic asymmetric potential to one or both of the electrode assemblies so as to generate a periodically asymmetric electric field in the channel for ion mobility separation. The channel walls define an ion separation channel of substantially helical shape.

FAIMS apparatus and method comprising an ion separation channel of helical shape

A method of increasing ion throughput within an accumulator, an energy lift and a pulsed ion extractor, operated in that order upon a batch of ions, comprising the steps of: firstly loading a batch of ions into the accumulator; secondly changing the electrical potential of the energy lift to raise the energy of the batch of ions contained therein; and thirdly ejecting the batch of ions from the pulsed ion extractor; and wherein: the energy lift is a separate device from the accumulator and the pulsed ion extractor, and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator and/or a previous batch of ions is prepared for ejection in the pulsed ion extractor; or the energy lift is incorporated into the pulsed ion extractor and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator; or the energy lift is incorporated into the accumulator and whilst changing the electrical potential in the second step a previous batch of ions is prepared for ejection in the pulsed ion extractor. A charged particle analyzer system is also provided.

Method and apparatus for improving the throughput of a charged particle analysis system

Methods and analyzers useful for time of flight mass spectrometry are provided. A method of determining properties of ions within a time of flight or electrostatic trap mass analyzer comprises the steps of: injecting ions into the mass analyzer; causing the ions to follow a portion of a main flight path within the mass analyzer, the main flight path comprising multiple changes of direction; applying a beam deflection to deflect at least some of the ions from the main flight path so that they impinge upon a detection surface located within the mass analyzer, the detection surface comprising part of an active field-sustaining electrode of the mass analyzer; measuring a quantity representative of the charge arriving at the detection surface caused by the impinging ions; determining, from the deflection applied, properties of a trajectory upon which the ions were travelling immediately prior to deflection, and/or determining, from the quantity measured, a value representative of the number of the ions that impinged upon the detector surface; and wherein the analyzer utilises an analyzer field, the detection surface sustains the analyzer field in its vicinity, and the analyzer field in the vicinity of the detection surface is substantially non-zero.

Mass spectrometry detector system and method of detection

Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.

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Bremen, Germany

Anastassios Giannakopulos