Intel Corporation

Other

Ananda G Sarangi

Gregory F Taylor

Edward Paul Osburn

Ian A Young

Yan A Borodovsky

Rachael Jade Parker

Sean R Babcock

Systems and methods are provided for displaying content on a vehicle with at least one display device coupled to a frame member and extending to the right or left of the license plate receiving area of the vehicle. Content is selected and altered as desired, including based on user preferences and/or vehicle location.

Content display on moving vehicles

A dynamic processor configuration and power-up programs a processor's fuse block with configuration signals during processor manufacturing. The processor configuration signals include a core voltage identifier and a system bus frequency identifier. When power is applied to the platform, a control signal is used to prevent power-up of the platform's processor related circuitry. While the platform awaits full power-up, the fuse block is powered up. When the fuse block is powered up, the control signal is used to allow the configuration signals to be read from the fuse block. The processor is configured with core voltage and system bus frequency based on the values read from the fuse block. The platform then performs its boot-up sequence.

Method and apparatus to ensure proper voltage and frequency configuration signals are defined before applying power to processor

Multistage configuration and power setting for a processor includes an on-die configuration signal fuse block programmed during manufacturing, configuration signal Control and I/O circuitry, a configuration change control signal output indicating when the configuration signals are going to change, and voltage regulators and clock generators that rely on the configuration change control signal to begin the system configuration change and boot sequences. The processor actively drives its configuration signal states. Multistage configuration and power setting also enables the processor to change its configuration states during operation.

Multistage configuration and power setting

A method and devices for a current dump circuit that includes a first termination device, a second termination device, and a current dump device. The first termination device resides outside the die of an IC. One end of the first termination device is operatively connected to a first voltage regulator. Another end of the first termination is device operatively connected to a signal line of the IC. The second termination device resides on a die of the IC. One end of the second termination device is operatively connected to a second voltage regulator. Another end of the second termination device is operatively connected to the signal line of the IC. The current dump device provides a path to remove any current flow between the first voltage regulator and the second voltage regulator.

Method and apparatus for balancing current in a system with two sets of termination devices

A method of enhancing the lithographic resolution of randomly laid out isolated structures is disclosed. A first mask comprises an active layer with isolated features such as gates. Portions of the active layer have a reduced dimension typical of periodic structures. The first mask additionally has complementary features provided along side the reduced active features to provide periodicity. In this way, the resolution of the lithographic process is enhanced, and other enhanced resolution technologies additionally can be used to best advantage to form a patterned photosensitive layer having isolated features of reduced width. The photosensitive layer is then exposed to a second mask which exposes the complementary features so that they are removed from the latent image in the photosensitive layer. This second exposure also further improves resolution by enhancing the contrast between exposed and unexposed regions. A method is disclosed for automatically providing random logic device layouts having the complementary features, as well as for providing a layout for the second mask.

Method of producing semiconductor device layer layout

A memory device having test circuitry incorporated into its design to enable direct external access to the bit lines of a single cell is described. When the device is put in test mode by applying external control signals, peripheral I/O circuitry is disabled. Once the I/O circuitry is disabled the test circuitry selects and enables the section of the array in which the selected cell is located through transfer circuits. The enabled transfer circuit for the selected section couples data between the selected cell and a set of predetermined I/O terminals.

Growing community of inventors

Beaverton, OR, United States of America

Ananda G Sarangi