Interface Optoelectronics (shenzhen) Co., Ltd.

An-Chi Hsu

Heng-Sheng Chou

Pang-Chiang Chia

Ying-chi Wang

A metal migration-proof touch panel structure is proposed to solve the problem: metal migration occurs in the active area of a metal mesh-based touch panel and causes short circuit in metal traces. The present invention is characterized in indirectly linking the ESD dummy to the ground terminal via an ESD protection element to replace the conventional design that directly connects the ESD dummy with the ground terminal. Thus, the ESD dummy and the ground terminal are normally in an open-circuit state. While ESD interference occurs, the ESD protection element an impedance approaching zero ohms and fast conducts the energy to the ground terminal to drain off the energy. The ESD protection element is a varistor or a transient voltage suppressor.

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Guangdong, China

An-Chi Hsu