Massachusetts Institute of Technology

An Chang

Rohit Nandkumar Karnik

Systems and methods for monitoring air particulate matter are provided herein that capture particles from the air for analysis. Particles are captured using electrostatic and/or mechanical means to deflect particles toward a substrate. Electrostatic precipitation causes charged carriers to deflect towards a charged substrate. Filtration-based means employ filters and/or fibers to capture particles from air flowing therethrough. A sensor such as a camera is used to read the captured particles. An illumination source directs light towards the substrate, causing the particles to scatter light, which the sensor can detect and derive information or imaging therefrom, which can also be used for further particle or pollution analyses. The substrate can be replenished using electrostatic techniques such as reverse electrostatic force, or mechanical means such as cleaning using a brush or replacing a tape substrate. Dynamic PM monitoring detects and makes adjustments such as those related to air volume, imaging characteristics and substrate replenishment.

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Cambridge, MA, United States of America

An Chang