General Electric Company

Amitabha Dutta

Manoj Kumar Koyithitta Meethal

Sandeep Kumar Dewangan

Gigi Olive Gambrell

Anandraj Sengupta

Shyamsunder Tondanur Mandayam

Preeti Pisupati

Gopichand Katragadda

Slvaramanivas Ramaswamy

In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity in an object. The testing apparatus includes an electrical conductor and a sensing device. In the exemplary testing device, the electrical conductor extends in a generally linear direction and is configured to route current in a direction generally transverse to a longitudinal axis of the object being tested. Routing of current through the electrical conductor creates remote field eddy current effect, which, in turn, affects a magnetic field around the test object. The testing apparatus also includes a sensing device located at a distance from the electrical conductor and configured to detect magnetic fields generated in response to current routed through the electrical conductor.

Method and apparatus for testing material integrity

A method and system for detecting weld signatures from an ultrasound scan data obtained from scanning a pipeline is provided. The method includes a step for mapping multiple amplitude responses from the ultrasound scan data, each amplitude response being representative of a respective sensor signal. Continuous amplitude responses are located from the amplitude responses and corresponding signatures are identified for the continuous amplitude responses. The method also includes a step for tagging the corresponding signatures as weld signatures.

Method and system for inspecting flaws using ultrasound scan data

An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.

Eddy current inspection method and system

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Orissa, India

Amitabha Dutta