Applied Materials, Inc.

Lasa Industries, Inc.

Amit Puri

Michael Robert Rice

Jeffrey C Hudgens

Robert B Lowrance

Eric Andrew Englhardt

Martin R Elliott

Kirk Van Katwyk

William A Barrett

In one aspect, a system is disclosed having a substrate carrier loader adapted to load substrate carriers onto a moving conveyor; and a controller coupled to the substrate carrier loader, the controller adapted to assist in at least one of alignment of the substrate carrier loader to the moving conveyor and calibration of the substrate carrier loader to the moving conveyor or a storage location. Numerous other aspects are provided.

Calibration of high speed loader to substrate transport system

In a first aspect, a first method of calibrating a substrate carrier loader to a moving conveyor is provided. The first method includes the steps of (1) providing a substrate carrier loader adapted to load substrate carriers onto a moving conveyor; (2) aligning the substrate carrier loader to the moving conveyor; and (3) calibrating the substrate carrier loader to the moving conveyor. Numerous other aspects are provided.

The present invention provides an apparatus and method to automatically focus an incident beam of monochromatic parallel planar light on a work piece, using a fringe plate and a vision detector. The work piece may have a perfect mirror surface, or have a non-reflective patterned surface. The incident light beam is focused on the work piece and then reflected through a fringe plate forming an interference pattern on the vision detector. The incident light beam is then scanned or wobbled. The wobbling incident light beam forms a distinctively oscillating output signal from the vision detector when the light is focused on the work piece. When the light is not focused on the work piece a distinctive and more constant output signal is produced by the vision detector. For a given position of the work piece, by noting whether the output signal is rapidly changing or relatively constant, the invention can automatically determine whether or not the work piece is at the focal point of the incident light beam. This can be used to automatically focus the etching or writing laser on the chip or wafer in a laser etching system. The present invention can also be used to automatically determine the focal surface of an objective lens.

Apparatus and method for automatic focusing of light using a fringe plate

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San Jose, CA, United States of America

Amit Puri