Sun Microsystems, Inc.

Amit Majumdar

Sridhar Narayanan

Hong Seok Kim

Embodiments of the present invention provide a method and apparatus for debugging an integrated circuit. In particular, one embodiment of the present invention includes steps of: (a) retrieving data from a design data base, and creating a design pattern in a pattern format, which design pattern includes stimulus data for stimuli to be applied to the integrated circuit and design response data for expected responses to the stimuli; (b) generating, responsive to the design pattern, a tester pattern and a test program for input to a tester; (c) testing the integrated circuit in the tester, responsive to the tester pattern and the test program, and generating a datalog that comprises test response data; and (d) generating a file, responsive to the datalog, wherein the test response data are reformatted into the pattern format.

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San Jose, CA, United States of America

Amit Majumdar