Pdf Solutions, Incorporated

Amit Joag

Christopher Hess

John Kibarian

Tomasz Brozek

Rakesh Vallishayee

David M Stashower

Yuan Yu

Meindert Martin Lunenborg

Hendrik Schneider

SiewHoon Ng

Abdul Mobeen Mohammed

Ben Shieh

An apparatus and method for testing two-terminal memory elements organized as a cross-point memory array. The apparatus allows functional testing of two-terminal memory elements organized as a cross-point memory array, and built in a short flow manufacturing process. The proposed apparatus substantially eliminates the use of any type of additional active or passive switches, selectors, or decoders. A large number of memory elements of various memory types including planar (two dimensional) or three dimensional memory structures can be tested without the need of manufacturing selectors or running the full flow process.

Passive array test structure for cross-point memory characterization

A Characterization Vehicle (CV) and a method for forming it which yields a gain in efficiency for IC yield ramp improvements by enabling faster learning cycles and diagnosis while reducing costs. A plurality of SF experiments are combined into a single full flow mask set with many inline testing points. Smaller pads are arranged in a way supporting testing of interleaved pad frames, parallel testing, and the usage of stacked test structures, or Devices Under Test (DUT's).

Reusable test chip for inline probing of three dimensionally arranged experiments

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Amit Joag