California Institute of Technology

Amirhossein Nateghi

Axel Scherer

Taeyoon Jeon

Frank Thomas Hartley

The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.

System for analyzing a test sample and method therefor

The present disclosure is directed toward optical elements, such as sample cuvettes, lenses, prisms, and the like, whose transmissivity is increased by the addition of a geometric anti-reflection layer disposed on at least one surface of the optical element, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of an optical signal incident on the surface passes through the interface. In some embodiments, every surface through which an optical signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the optical element, in some embodiments, the use of low-cost, high-refractive-index materials, such as conventional silicon, is enabled.

Cuvette having high optical transmissivity and method of forming

The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.

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Pasadena, CA, United States of America

Amirhossein Nateghi