Cypress Semiconductor Corporation

Infineon Technologies LLC

Amir Rochman

Amichai Givant

Yoram Betser

Shivananda Shetty

Pawan Kishore Singh

Kobi Danon

Stephan Rosner

Cliff Zitlaw

Yair Sofer

Yoav Yogev

Yi He

James Minsu Pak

Stefano Amato

Avri Harush

Cindy Sun

Idan Koren

Jonas Neo

Ori Tirosh

Systems, methods, and devices implement counters with fault tolerance and power loss protection. Systems include a non-volatile memory device that includes a first counter configured to store a first plurality of data values representing a plurality of count operations, and a second counter configured to store a second plurality of data values representing an initiation and a completion of each erase operation performed on the first counter. Systems also include control circuitry configured to generate a count value based on a current counter value of the first counter, a current counter value of the second counter, and at least one physical parameter of the first counter.

Continuous monotonic counter for memory devices

A non-volatile memory has an array of non-volatile memory cells, first reference word lines and second reference word lines, and sense amplifiers. The sense amplifiers read system data, that has been written to supplemental non-volatile memory cells of the first reference word lines, using comparison of the supplemental non-volatile memory cells of the first reference word lines to supplemental non-volatile memory cells of the second reference word lines. Status of erasure of the non-volatile memory cells of the array is determined based on reading the system data.

Erase power loss indicator (EPLI) implementation in flash memory device

Systems, methods, and devices include counters configured to implement count operations. Systems include non-volatile memory devices which include a first counter configured to store a first plurality of data values representing a plurality of count operations, and a second counter configured to store a second plurality of data values representing a number of erase operations applied to the first counter. Systems further include control circuitry configured to implement read, write, and erase operations for the first counter and the second counter, determine a partial count value based, at least in part, on a current value of the second counter and at least one physical parameter of the first counter, and generate a count value by adding the partial count value with a current value of the first counter. Such counters and control circuitry are immune data loss due to power loss events.

Systems, methods, and devices dynamically configure non-volatile memories. Devices include non-volatile memories comprising a plurality of memory regions, each of the plurality of memory regions having a configurable bit density. Devices also include control circuitry configured to retrieve user partition configuration data identifying a plurality of bit densities for the plurality of memory regions, convert a received user address to a plurality of physical addresses based, at least in part, on the plurality of bit densities, compare the user address with the user partition configuration data, and select one of the plurality of physical addresses based, at least in part, on the comparison.

Dynamic configuring of reliability and density of non-volatile memories

A memory device that includes a first port and a second port. The first port includes a first clock input, at least one first command address input, and at least one data input or output configured to transfer data in relation to the memory device. The second port includes a second clock input and at least one command, address, and data input/output (I/O) configured to receive command and address information from, and to transfer data in relation to the memory device. The memory device also includes a plurality of memory banks, in which two different memory banks may be accessed respectively by the first and the second ports concurrently. Other embodiments of the memory device and related methods and systems are also disclosed.

Multi-ported nonvolatile memory device with bank allocation and related systems and methods

A nonvolatile memory device can include a serial port having at least one serial clock input, and at least one serial data input/output (I/O) configured to receive command, address and write data in synchronism with the at least one serial clock input. At least one parallel port can include a plurality of command address inputs configured to receive command and address data in groups of parallel bits and a plurality of unidirectional data outputs configured to output read data in parallel on rising and falling edges of a data clock signal. Each of a plurality of banks can include nonvolatile memory cells and be configurable for access by the serial port or the parallel port. When a bank is configured for access by the serial port, the bank is not accessible by the at least one parallel port. Related methods and systems are also disclosed.

A non-volatile memory device and methods for operating the same are provided. The memory device may have multiple complementary memory cells. The method of blank check includes detecting a state value of each of the true and complementary transistors, generating an upper state value, Wherein a first predetermined amount of the true and complementary transistors have greater state values than the upper state value, generating a lower state value, wherein a second predetermined amount of the true and complementary transistors have less state values than the lower state value, generating a state value range based on a difference between the upper state value and the lower state value, and comparing the state value range to a threshold value to determine whether the plurality of complementary memory cells is in a blank state or a non-blank state. Other embodiments are also disclosed herein.

Non-volatile memory device and method of blank check

Disclosed are methods for reading a set of bits from a NVM array (such as a SPI or parallel NOR NVM or otherwise) including: retrieving each of the set of bits from the NVM array substantially in parallel, applying substantially in parallel to each of the retrieved bits a segmented search, each search indexed using an order number of the respective bit being checked, and correcting a bit whose search indicates an error.

Methods, circuits, systems and computer executable instruction sets for providing error correction of stored data and data storage devices utilizing same

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Tel Aviv, Israel

Amir Rochman