Ulis

Lynred

Amaury Saragaglia

Alain Durand

The invention relates to a method for detecting bad pixels from a pixel array of a device, for capturing an image, that is sensitive to infrared radiation. The method includes: receiving an input image captured by the pixel system, and calculating a score for a plurality of target pixels including at least some of the pixels from the input image. The score for each target pixel is generated on the basis of k pixels of the input image that are selected in a window of H by H pixels around the target pixel. H is an odd integer greater than or equal to 3, and k is an integer between 2 and 5. Each pixel, from the set formed of the k pixels and the target pixel, share at least one border or corner with another pixel from said set, and the values of the k pixels are at respective distances from the value of the target pixel, the k pixels being selected on the basis of the k distances. The method also includes detecting that at least one of the target pixels is a bad pixel on the basis of the calculated scores.

Detection of bad pixels in an infrared image-capturing apparatus

Correction of bad pixels in an infrared image-capturing apparatus

The invention concerns a method of image processing involving: receiving, by a processing device, an input image (IB) captured by a pixel array sensitive to infrared radiation; determining, based on the input image and on a column component vector (VCOL), a first scale factor (&#x3b1;) by estimating a level of the column spread present in the input image; generating column offset values (&#x3b1;.VCOL(y)) based on the product of the first scale factor with the values of the vector; determining, based on the input image and on a 2D dispersion matrix (IDISP), a second scale factor (&#x3b2;) by estimating a level of the 2D dispersion present in the input image; generating pixel offset values (&#x3b2;.IDISP(x,y)) based on the product of the second scale factor with the values of the matrix; and generating a corrected image (IC') by applying the column and pixel offset values.

Growing community of inventors

Eybens, France

Amaury Saragaglia