Centre National De La Recherche Scientifique

Ecole Superieure De Physique Et De Chimie Industrielles De La Ville De Paris

Boston University

Amaury Badon

Mathias Fink

Alexandre Aubry

William Lambert

Claude Boccara

Victor Barolle

Laura Cobus

Jerome Charles Mertz

Jean-Marc Tsang Min Ching

Timothy Weber

Sheng Xiao

The present invention relates to a method for the non-invasive optical characterization of a heterogeneous medium, comprising: a step of illuminating, by means of a series of incident light waves, a given field of view of the heterogeneous medium, positioned in a focal plane of a microscope objective (); a step of determining a first distortion matrix (D, D) in an observation basis defined between a conjugate plane of the focal plane (FP) and an observation plane, said first distortion matrix corresponding, in a correction basis defined between a conjugate plane of the focal plane and an aberration correction plane, to the term-by-term matrix product of a first reflection matrix (R) of the field of view, determined in the correction basis, with the phase conjugate matrix of a reference reflection matrix, defined for a model medium, in said correction basis; and a step of determining, from the first distortion matrix, at least one mapping of a physical parameter of the heterogeneous medium.

Method and systems for the non-invasive optical characterization of a heterogeneous medium

In a first aspect, the present description relates to a system for non-invasively characterizing a heterogeneous medium using ultrasound, comprising at least one first array () of transducers configured to generate a series of incident ultrasound waves in a region of said heterogeneous medium and record the ultrasound waves which are backscattered by said region as a function of time, as well as a computing unit () which is coupled to said at least one first array of transducers and configured to: record an experimental reflection matrix defined between an emission basis at the input and the basis of the transducers at the output; determine, from said experimental reflection matrix, at least one first wideband reflection matrix defined in a focused base at the input and output; determine a first distortion matrix defined between said focused basis and an observation basis, said first distortion matrix resulting, directly or after a change of basis, from the term-by-term matrix product of said first wideband reflection matrix defined between said focused basis and an aberration correction basis, with the phase-conjugated matrix of a reference reflection matrix defined for a model medium, between the same bases; determine, from said first distortion matrix, at least one mapping of a physical parameter of said heterogeneous medium.

Methods and systems for non-invasively characterizing a heterogeneous medium using ultrasound

A Multi-Z confocal microscopy system can simultaneously record from multiple Z-sections, and thus performs high speed volumetric imaging. An illumination line can be formed by under-filling the illumination beam in the aperture of the microscope objective. The illumination line extends in the Z dimension into the target sample to be imaged and an X-Y scanning mechanism can be used to scan the illumination line over the sample. The detection signal emanating from the scanned sample can be collected through the full numerical aperture of the microscope objective and directed to a detector subsystem. The detector subsystem includes an array of reflecting pinhole detectors and each reflecting pinhole detector is configured to image a volume at a different depth in the sample. This configuration enables reflecting pinhole detector array to image more than one depth volume at the same time.

Multi-Z confocal imaging system

Growing community of inventors

Brookline, MA, United States of America

Amaury Badon