Intest Corporation

Intest IP Corporation

Alyn R Holt

Christopher L West

I Marvin Weilerstein

Robert E Matthiessen

Brian R Moore

Daniel J Graham

Henri M Akouka

Richard C Powell, Jr

Naum Gudin

Nils O Ny

Nil O Ny

A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counter-blancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.

Counter balanced vertical docking motion in a driven vertical axis test head manipulator

A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

Test head docking system and method

A load, such as an electronic test head, is supported. A force sensor detects a force received from the load, the force resulting from the load being imbalanced such that a torque is created about a rotational axis of the load. A source of force provides a counter force relative to the load in response to the force detected by the force sensor. A method of docking an electronic test head held in a test head manipulator to an electronic device handler is also provided. The method of docking includes measuring a magnitude of an imbalance force along or about at least one of a plurality of motion axes of the test head manipulator; and providing a counter force to the imbalance force.

Apparatus and method for balancing and for providing a compliant range to a test head

A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.

Test head manipulator

A load, such as an electronic test head, is supported. A force sensor detects a force received from the load, the force resulting from the load being imbalanced such that a torque is created about a rotational axis of the load. A source of force provides a counter force relative to the load in response to the force detected by the force sensor. A method of docking an electronic test head held in a test head manipulator to an electronic device handler is also provided. The method of docking includes measuring a magnitude of an imbalance force along or about at least one of a plruality of motion axes of the test head manipulator; and providing a counter force to the imbalance force.

A safety lock system prevents unlocking of a balanced loaded unit when the loaded unit becomes unbalanced. A plurality of calipers applies pressure on opposite sides of a guide rail. A lock block couples the load to at least one of the calipers for movement of the load along the guide rail. A rotatable handle is coupled to the calipers through a shaft. Rotation of the handle locks or unlocks the lock block against vertical movement. A safety block is coupled to the loaded unit and is moveable with the loaded unit for preventing rotation of the handle upon a preselected movement of the loaded unit relative to the lock block.

Safety lock system for test head mount

A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a support structure for moving the test head along a second axis orthogonal to the first axis. The support structure accurately docks the electronic test head with the device handler.

Method and apparatus automated docking of a test head to a device handler

Method and apparatus for automated docking of a test head to a device

A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a linkage arm structure for moving the test head along a second axis orthogonal to the first axis. Using motors, sensors and a processor, the linkage arm structure accurately docks the electronic test head with the device handler.

A device testing system of the type in which an electronic test head is mounted for pivotal movement about three orthogonal axes. Cables are connected between a test cabinet and the test head to carry electronic signals. The test head is directly mounted to, and the cable is introduced to the test head through, a single piece cable pivot. The single piece cable pivot is attached to its housing by a method of installation which includes attaching cam followers to the housing through an opening included in the ring.

Device testing system with cable pivot and method of installation

A system is disclosed for positioning an electronic test head with respect to an electronic device handler. The positioner assembly includes separate locks which allow the test head to move vertically while preventing rotation of the test head about the main shaft. Thus, the test head can be aligned with the device handler, moved vertically away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. Alternatively, the separate locks allow the test head to rotate about the main shaft while preventing movement along the main shaft. Thus, the test head can be aligned with the device handler, rotated about the main shaft and away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. An index pin allows the test head to be rotated from an initial position to a temporary position and then rotated from the temporary position back to the initial position without requiring realignment of the test head relative to the device handler. The system includes a projected cradle assembly which allows the heavy test head to be projected above or below a physically large handler while still pivoting the load of the test head with its cable assembly at its center of gravity.

A positioner facilitates docking and undocking of an electronic test head with a device handler. The position provides for rotation of the test head about a first axis. The positioner includes a scissor arm structure for moving the test head along a second axis orthogonal to the first axis

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Cherry Hill, NJ, United States of America

Alyn R Holt