Ansys, Inc.

Gear Design Solutions

Altan Odabasi

Scott Johnson

Emrah Acar

Joao Moreno Geada

John Lee

Murat Becer

Lei Yin

William Alan Mullen

Aveek Sarkar

Sudarsana Reddy Mallu

Mustafa Yazgan

Tinu Thomas

Mirza Milan

Youlin Liao

Methods, systems and media for simulating or analyzing voltage drops in a power distribution network can use an incremental approach to define a portion of a design around a victim to capture a sufficient collection of aggressors that cause appreciable voltage drop on the victim, and then an incremental simulation of just the portion can be performed rather than computing simulated voltage drops across the entire design. This approach can be both computationally efficient and can limit the size of the data used in simulating dynamic voltage drops in the power distribution network. Multiple different portions can be simulated separately in separate processing cores or elements. In one embodiment, a system can provide options of user selected constraints for the simulation to provide better accuracy or use less memory. Better accuracy will normally use a larger set of aggressors for each victim at the expense of using more memory.

DVD simulation using microcircuits

A chip package system comprising N multiple processor cores can be tested by receiving a data file characterizing the chip package system. Thereafter, simulation testing is conducted for each core for each of Mstates using the data file such that each core is active in each state while all other cores are inactive. Each simulation test results in a simulation. The simulations are then combined to result in a composite test covering Mcombinations. Related apparatus, systems, techniques and articles are also described.

Integrated circuit composite test generation

Methods, systems and media for simulating or analyzing voltage drops in a power distribution network can use an iterative approach to define a portion of a design around a victim to capture a sufficient collection of aggressors that cause appreciable voltage drop on the victim. This approach can be both computationally efficient and accurate and can limit the size of the data used in simulating dynamic voltage drops in the power distribution network.

Voltage drop analysis using local circuit representation

Techniques for computer aided design and engineering of integrated circuits can use group identifiers of correlated signals and time delay values when using vectorless dynamic voltage drop (DVD) simulations and when using other types of simulations or analyses of a circuit design. A method in one embodiment can include the operations of: receiving a design representing an electrical circuit that includes a plurality of pins, the plurality of pins including one or more input nodes or one or more output nodes in the electrical circuit; identifying, in the design, one or more groups of pins that are correlated such that, within each identified group, all of the pins in the identified groups switch between voltage states in a correlated way; assigning, for each pin in each identified group, an identifier for the identified group and a time delay value based on the pin's delay from an initial point in the identified group's logic chain to the pin. The group identifier and the time delay at each pin can limit the switching activities in the DVD simulations to reduce pessimistic results from the simulations. Other methods are described, and data processing systems and machine readable media that cause such systems to perform these methods are also described.

DVD analysis that accounts for delays

This disclosure describes methods, systems and media for analyzing voltage drops in a power delivery network in a simulated design of an electrical circuit. In one embodiment, a system determines, for a victim element ('victim'), a voltage drop caused by each aggressor element ('aggressor') in a set of aggressors in the design and creates a data structure that includes, for each victim, at least one of: (1) each voltage drop caused by each aggressor in the set of aggressors or (2) a sum of the voltage drops on the victim caused by all of the aggressors in the set of aggressors. The system can then compute a set of simulations based on random inputs to generate a distribution of possible voltage drops for each victim using data in the data structure.

Dynamic voltage drop analysis with improved coverage

Described herein are systems and methods for a partitioned extraction-simulation technique that efficiently combines a partitioned extraction technique and a partitioned simulation technique by removing and not performing particular steps of the techniques to provide a more efficient netlist extraction and circuit simulation process. In some embodiments, a plurality of circuit simulators directly receive and process a plurality of sub-region netlists that are based on a spatial partitioning of the IC layout. In further embodiments, an EDA hybrid cloud system is implemented using pipelining and serializing of memory data. In these embodiments, an overall EDA process is divided into a plurality of pipelined stages to accelerate the computational speed of the overall EDA process. In further embodiments, EDA data is transferred, over a network, from a memory of one computer system directly to a memory of another computer system by serializing the EDA data.

Growing community of inventors

Austin, TX, United States of America

Altan Odabasi