Applied Materials, Inc.

Kla Tencor Corporation

Ali Salehpour

Mehdi Vaez-Iravani

Robert Jan Visser

Jaydeep K Sinha

George J Kren

Manivannan Thothadri

Pradeep Vukkadala

Kurt Lindsay Haller

Jiayao Zhang

John Busch

Implementations described herein generally relate to flexible display devices and cover lens assemblies with flexible cover lens. In one or more embodiments, a cover lens assembly is provided and includes a first flexible cover lens, a second flexible cover lens, and a sacrificial adhesion disposed between the first flexible cover lens and the second flexible cover lens. The first flexible cover lens includes a first hard coat layer having a hardness in a range from about 4H to about 9H and a first substrate. The second flexible cover lens includes a second hard coat layer having a hardness in a range from about 2H to about 9H. The first substrate is disposed between the first hard coat layer and the sacrificial adhesion layer.

Replaceable cover lens for flexible display

A method of providing high accuracy inspection or metrology in a bright-field differential interference contrast (BF-DIC) system is described. This method can include creating first and second beams from a first light beam. The first and second beams have round cross-sections, and form first partially overlapping scanning spots radially displaced on a substrate. Third and fourth beams are created from the first light beam or a second light beam. The third and fourth beams have elliptical cross-sections, and form second partially overlapping scanning spots tangentially displaced on the substrate. At least one portion of the substrate can be scanned using the first and second partially overlapping scanning spots as the substrate is rotated. Radial and tangential slopes can be determined using measurements obtained from the scanning using the first and second partially overlapping scanning spots. These slopes can be used to determine wafer shape or any localized topography feature.

Bright-field differential interference contrast system with scanning beams of round and elliptical cross-sections

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Saratoga, CA, United States of America

Ali Salehpour