Interatom Gmbh

Alfred Zentis

Dieter Stausebach

Gunther Schumacher

Ernst Klas

Rudolf Schmidt

A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electrically conducting parts disposed on the mounts having electrical properties being influenced by the shifting of the mounts, at least a portion of each of the electrically conducting parts being subjected to mechanical stresses, and at least the portions of the electrically conducting parts being formed of electrically conductive ceramic material.

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Eschweiler, Germany

Alfred Zentis