Rasco Gmbh

Alfred Langer

Alexander Waldauf

Christian Hellmuth

The present invention relates to a guide device comprising a baseplate unit having formed therein a guide channel for guiding electronic devices, wherein at least two portions of the baseplate unit are spatially fixed, said guide device being characterized in that means for compensating the thermal expansion of the baseplate unit are provided. The invention additionally relates to a test apparatus which comprises the guide device according to the present invention.

Guide device and test apparatus for electronic devices

The invention relates to a device for testing electronic components () with at least two mechanical transfer elements (), of which each can be loaded in each case at a dedicated loading position with an electronic component () and with a common test position (), into which the two transfer elements (5) can be brought. Furthermore, the invention relates to a device for testing electronic components with at least two mechanical transfer elements (), of which each can be loaded in each case at a common loading position () with an electronic component () and with a common test position (), into which the two transfer elements (80) can be brought. The invention also relates to the associated method.

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Kolbermoor, Germany

Alfred Langer