Micron Technology Incorporated

Aptina Imaging Corporation

Given Imaging Ltd.

Alf Olsen

Eric R Fossum

Giuseppe Rossi

Espen A Olsen

Arkady Glukhovsky

Dov Avni

Steinar Iversen

Jorgen Moholt

Per Olaf Pahr

Jørgen Moholt

An imager and a method for real-time, non-destructive monitoring of light incident on imager pixels during their exposure to light. Real-time or present pixel signals, which are indicative of present illumination on the pixels, are compared to a reference signal during the exposure. Adjustments, if necessary, are made to programmable parameters such as gain and/or exposure time to automatically control the imager's exposure to the light. In a preferred exemplary embodiment, only a selected number of pixels are monitored for exposure control as opposed to monitoring the entire pixel array.

Image sensor including real-time automatic exposure control and swallowable pill including the same

Real-time exposure control for automatic light control

A system which operates to determine temperature of an image sensor using the same signal chain that is used to detect the image sensor actual outputs. A correlated double sampling circuit is used to obtain the image outputs. That's same correlated double sampling circuit is used to receive two different inputs from the temperature circuit, and to subtract one from the other. The temperature output can be perceived, for example, once each frame.

Double sample active pixel sensor with double sampling temperature sensor

Methods and circuits for reducing noise for a passive pixel sensor (PPS) array of an image sensor are described. A noise reduction circuit includes a noise reduction integrator circuit configured to detect a potential voltage of a column line of the PPS array and generate a potential voltage substantially equal to the potential voltage of the column line. The noise reduction circuit also includes a conductor line oriented longitudinally along the column line and configured to receive the generated potential voltage from the noise reduction integrator circuit. The conductor line is placed at a potential voltage that is the same as the potential voltage of the column line. A parasitic capacitance formed between the conductor line and the column line is substantially reduced.

Noise and parasitic capacitance reduction for 1T pixel CMOS image sensors

Signals from an imager pixel photodetector are received by an amplifier having capacitive feedback, such as a capacitive transimpedance amplifier (CTIA). The amplifier can be operated at a low or no power level during an integration period of a photodetector to reduce power dissipation. The amplifier can be distributed, with an amplifier element within each pixel of an array and with amplifier output circuitry outside the pixel array. The amplifier can be a single ended cascode amplifier, a folded cascode amplifier, a differential input telescopic cascode amplifier, or other configuration. The amplifier can be used in pixel configurations where the amplifier is directly connected to the photodetector, or in configurations which use a transfer transistor to couple signal charges to a floating diffusion node with the amplifier being coupled to the floating diffusion node.

Amplification with feedback capacitance for photodetector signals

Methods, devices, and systems for offset cancellation in an amplifier are disclosed, wherein the amplifier inputs may be exposed to large loads from an array of pixel columns coupled in parallel. During a cancellation phase, an amplifier offset may be canceled by selectively coupling a first amplifier output to a first amplifier input and a second amplifier output to a second amplifier input. During a portion of the cancellation phase, a buffer may use the first amplifier input to drive a first pixel signal. During a different portion of the cancellation phase, the buffer may use the second amplifier input to drive a second pixel signal. To sense the pixel columns during an amplification phase, the first and second pixel signals are coupled to the first and second amplifier inputs, respectively, with the result that the amplifier offset and the buffer offset are cancelled from the amplifier output.

Amplifier offset cancellation devices, systems, and methods

Double sampling active pixel sensor with double sampling temperature sensor

A system and method for providing a clock-independent reset signal based on supply voltage threshold levels is described. The trip points or predefined voltage levels where the power-on-reset circuit behavior reverses (which controls the reset signal) is determined by the dimensions of the transistors selected for the voltage dividers. The system and method described allows for a clock-independent stable power-up phase while consuming a very small area of a circuit board and, in particular, on integrated circuits.

Power-on-reset circuit based on the threshold levels and quadratic I-V behavior of MOS transistors

A system and method for providing a clock-independent reset signal based on supply voltage threshold levels is described. The trip points or predefined voltage levels where the power-on-reset circuit behavior reverses (which controls the reset signal) is determined by the dimensions of the transistors selected for the voltage dividers. The system and method described allows for a clock-independent stable power-up phase wile consuming a very small area of a circuit board and, in particular, on integrated circuits.

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Oslo, Norway

Alf Olsen