Aiq Dienstleistungen Ug (haftungsbeschrankt)

Advantest (singapore) Pte Ltd

Verigy Pte. Ltd.

Alf Clement

Gregor Cedilnik

Bernd Laquai

Thomas Lauber

Markus Van Riesen

Aldemar Dünkel

Henrik Hoff

Michael Daub

An arrangement having an electric cable, at least one fiber at least a part of which being aligned along and motionally coupled with the electric cable, and a device for detecting effects in the electric cable via said at least one fiber.

Fiber aligned and motionally coupled with electric cable

A fiber measurement device for measuring a physical quantity by a fiber and a method for shaping a pulse of electromagnetic radiation are disclosed. The fiber measurement device comprises an electromagnetic radiation source and an adjustment unit. The electromagnetic radiation source generates at least one pulse of electromagnetic radiation as primary electromagnetic radiation to be coupled into the fiber, and an adjustment unit. The adjustment unit, prior to, during or after application of the primary electromagnetic radiation to the fiber, adjusts a shape of the at least one pulse for at least partially compensating a deviation between a target shape and an actual shape of the at least one pulse.

Fiber measurement with pulse shaping

A distributed sensing device for determining a physical quantity which includes a measuring unit configured for measuring signals over time and space by distributed sensing, a determining unit configured for determining, based on the measured signals, data being correlated to the physical quantity, and a filtering unit configured for filtering the data to reduce noise and substantially preserve real features based on at least one filter parameter which is determined depending on the data which relate to the physical quantity at a plurality of different times.

Filtering distributed sensing data

A chip tester for testing at least two devices under test connected to the chip tester has a timing calculator for generating a timing information for the channels of the chip tester. The timing calculator is adapted to obtain a propagation delay difference information describing a difference between, on the one hand, a propagation delay from the first channel port of the chip tester to the first terminal of the first device under test and, on the other hand, a propagation delay from the first channel port of the chip tester to the second terminal of the second device under test. The timing calculator is adapted to provide a timing information for a second channel of the chip tester connected to the first device under test or to the second device under test on the basis of the propagation delay difference information. The channel module configurator is adapted to configure the second channel of the chip tester on the basis of the timing information.

Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test

Growing community of inventors

Gärtringen, Germany

Alf Clement