Schlumberger Technology Corporation

Other

Alexis Petit

Julian J Pop

Kentaro Indo

Sepand Ossia

Tullio Moscato

Maxim Nikolayevich Yushko

Tudor Ioan Palaghita

Zeynep Alpman

Kai Hsu

Vivek Agarwal

A method for sampling a downhole formation fluid includes pumping formation fluid into the flowline of a downhole sampling tool While pumping, a saturation pressure of the formation fluid is measured. The pumping rate is adjusted such that the fluid pressure in the flowline remains above a threshold saturation pressure.

Flowline saturation pressure measurements

A method for sampling a downhole formation fluid includes pumping formation fluid into the flowline of a downhole sampling tool, measuring a saturation pressure of the formation fluid in the flowline while pumping, and adjusting the pumping rate such that the fluid pressure in the flowline remains within a predetermined threshold above the measured saturation pressure.

Flowline saturation pressure measurement

A method for sampling a downhole formation fluid includes pumping formation fluid into the flowline of a downhole sampling tool. The method can also include measuring a saturation pressure of the formation fluid in the flowline while pumping. The method can also include adjusting the pumping rate such that the fluid pressure in the flowline remains within a predetermined threshold above the measured saturation pressure.

A method for sampling a downhole formation fluid that includes pumping formation fluid into the flowline of a downhole sampling tool. The method also includes measuring a saturation pressure of the formation fluid in the flowline while pumping, and adjusting the pumping rate such that the fluid pressure in the flowline remains within a predetermined threshold above the measured saturation pressure.

A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.

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Dhahran, Saudi Arabia

Alexis Petit