Carl Zeiss Meditec Gmbh

Carl Zeiss Meditec Ag

Alexandre R Tumlinson

Matthew J Everett

Nathan Shemonski

Tilman Schmoll

Keith E O'Hara

Yuan Liu

Utkarsh Sharma

Rainer Leitgeb

Abhishek Kumar

Angelo Rago

Lingfeng Yu

Michael Kempe

Paul Francis Stetson

Harihar Narasimha-Iyer

Siddharth Srivastava

Conor Leahy

Xiaoxian Guo

Martin Peschka

David Nolan

Systems and methods for improved interferometric imaging are presented. One embodiment is a partial field frequency-domain interferometric imaging system in which a light beam is scanned in two directions across a sample and the light scattered from the object is collected using a spatially resolved detector. The light beam could illuminate a spot, a line or a two-dimensional area on the sample. Additional embodiments with applicability to partial field as well as other types of interferometric systems are also presented.

Frequency-domain interferometric based imaging systems and methods

The present application describes the addition of various feedback mechanisms including visual and audio feedback mechanisms to an ophthalmic diagnostic device to assist a subject to self-align to the device. The device may use the visual and non-visual feedback mechanisms independently or in combination with one another. The device may provide a means for a subject to provide feedback to the device to confirm that an alignment condition has been met. Alternatively, the device may have a means for sensing when acceptable alignment has been achieved. The device may capture diagnostic information during the alignment process or may capture after the alignment condition has been met.

Alignment improvements for ophthalmic diagnostic systems

Various optical systems equipped with diode laser light sources are discussed in the present application. One example system includes a diode laser light source for providing a beam of radiation. The diode laser has a spectral output bandwidth when driven under equilibrium conditions. The system further includes a driver circuit to apply a pulse of drive current to the diode laser. The pulse causes a variation in the output wavelength of the diode laser during the pulse such that the spectral output bandwidth is at least two times larger than the spectral output bandwidth under the equilibrium conditions.

Interferometry with pulse broadened diode laser

The present application describes the addition of various feedback mechanisms including visual and audio feedback mechanisms to an ophthalmic diagnostic device to assist a subject to elf align to the device. The device may use the visual and non-visual feedback mechanisms independently or in combination with one another. The device may provide a means for a subject to provide feedback to the device to confirm that an alignment condition has been met. Alternatively, the device may have a means for sensing when Acceptable alignment has been achieved. The device may capture diagnostic information during the alignment process or may capture after the alignment condition has been met.

Ophthalmic imaging systems, particularly slit-scanning ophthalmo-scopes, are capable of characterizing refraction over the entire field of view of the system. Light from the light source of the system illuminates a region of the eye and the returning light is measured on a detector. The deviation of the location of the returning light from a predetermined location on the detector is measured. The deviation corresponds to the mismatch between the refractions of the imaging system and the eye. The light can be scanned across the full field of view to characterize the entire field. A second illumination source traveling along a second illumination path can be used to improve the characterization. The characterization can be of use for optimizing the focus of the instrument and for assessing the condition of the eye, including assessing myopia and astigmatism in the periphery.

Systems and methods for characterizing refraction with ophthalmic imaging systems

Various optical systems equipped with diode laser light sources are discussed in the present application. One example system includes a diode laser light source for providing a beam of radiation. The diode laser has a spectral output bandwidth when driven under equilibrium conditions. The system further includes a driver circuit to apply a pulse of drive current to the diode laser. The pulse causes a variation in the output wavelength of the diode laser during the pulse such that the spectral output bandwidth is at least two times larger the spectral output bandwidth under the equilibrium conditions.

Various systems and methods for sequential angle illumination to achieve ultra-high resolution optical coherence tomography (OCT) images. One example OCT system includes a light source, a beam divider, sample arm optics, a detector, and a processor. The light source generates a light beam to illuminate the sample. The beam divider separates the light beam into reference and sample arms. The sample arm optics sequentially illuminates a location in the sample with the light beam from different angles. The detector receives light returned from the reference arm and the sample illuminated at each angle and generates signals. The processor combines the signals to generate an image, which has a transverse resolution that is higher than the transverse resolution achieved from the signal generated from a single angle.

Systems and methods for improved OCT measurements

Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented.

Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging

Improved line-field imaging systems incorporating planar waveguides are presented. In one embodiment the optics of the system are configured such that a line of light on the light scattering object is imaged to the planar waveguide in at least one dimension. Embodiments where the waveguide incorporates a beamsplitter of an interferometer, where the beam divider and waveguide are referenced to one or more common surfaces, and wherein the source and waveguide are optically coupled, are also considered. In another embodiment, the planar waveguide is in contact or close proximity to the light scattering object.

Line-field imaging systems and methods incorporating planar waveguides

An OCT system comprises an OCT scan module for retinal scanning and an add-on anterior segment scanning module which includes at least one anterior segment scan lens () and an add-on fixation target () which is used to maintain the viewing direction of the eye () under investigation while achieving anterior segment scanning. Because the anterior segment scan module added to the exterior of an existing OCT system for retinal scanning has an add-on fixation target (), it is possible to maintain the viewing direction of the eye () under investigation while carrying out anterior segment scanning without adjusting the internal beam path of the OCT system, and the OCT system of the present invention can be adapted to patients with only one functioning eye.

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San Leandro, CA, United States of America

Alexandre R Tumlinson