De La Rue International Limited

Alexandre Gret

Ronald Bruce Blair

Hansjorg Klock

Edward John Brindley

Cirillo Ghielmetti

Sushil Bhattacharjee

A method of determining the authenticity of a document of value provided with a watermark pattern, the method comprising determining whether the watermark pattern exhibits a discontinuity.

Method and apparatus for determining authenticity

We provide an apparatus and method for analysing a security document. An x-ray source is adapted to illuminate at least one inspection region of the security document when located at an inspection position. An x-ray detector adapted to receive x-rays from the at least one inspection region of the document and to generate a corresponding detector response. A processor analysis the detector response and generates an output signal indicative of the structure of the document in the at least one inspection region.

Apparatus and method for analysing a security document

We provide an apparatus and method for analysing a security document. An x-ray source is adapted to illuminate at least one inspection region of the security document when located at an inspection position. An x-ray detector adapted to receive x-rays from the at least one inspection region of the document and to generate a corresponding detector response. A processor analyses the detector response and generates an output signal indicative of the structure of the document in the at least one inspection region.

Apparatus for analysing a security document

A method is provided of detecting a region of raised material on a document surface. A surface of the document is illuminated with at least one angled radiation beam such that any raised material on the document surface reflects the radiation. The surface containing the raised material is imaged using at least one radiation detector. The image is then processed to detect the existence on the document surface of the raised material. The illuminating step causes a reflection and/or shadow to be generated from at least one edge of the raised material. The processing step detects the location of the material using the said reflection and/or shadow from the at least one edge.

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Alexandre Gret