Rohde and Schwarz Gmbh & Co. Kg

Rhode & Schwarz Gmbh & Co. Kg

Alexander Roth

Florian Ramian

Gregor Feldhaus

Wolfgang Dressel

Matthias Ruengeler

Klaus Danzeisen

Wolfgang Wendler

Hagen Eckert

Michael Simon

Georg Ortler

Paul Gareth Lloyd

Hermann Boss

Darren Tipton

Christian Kuhn

Thomas Bechteler

Manfred M&uuml;ller

Juergen Rademacher

Ernst Polz

Bernhard Gaede

Robert Wanner

A measurement application device calibration unit, system, and method includes at least one coupling element comprising a first and second connections for coupling the coupling element into a signal measurement path that is coupled to a measurement application device, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive a predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined known calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

Measurement application device calibration unit, measurement system, method

A radio frequency testing apparatus with voltage standing wave ratio adjustment for testing a device under test is provided. Said radio frequency testing apparatus comprises an input, an output, a signal source for providing a test signal for the device under test via the output, thereby forming an output signal path, a signal sink for receiving a received signal from the device under test via the input, thereby forming an input signal path, and a tracking generator. In this context, the tracking generator and/or the signal sink is configured to determine a corresponding voltage standing wave ratio at the input and/or at the output. Furthermore, the signal source is configured to pre-equalize the test signal on the basis of the corresponding voltage standing wave ratio at the output and/or the input. In addition to this or as an alternative, the signal sink is configured to post-correct the received signal on the basis of the corresponding voltage standing wave ratio at the input and/or the output.

Radio frequency testing apparatus with voltage standing wave ratio adjustment and corresponding method

A method of providing signal level performance information with respect to an electronic component is described. The electronic component includes a signal input. An input signal is received at the signal input or immediately upstream of the signal input. At least one power level parameter is determined, wherein the power level parameter is indicative of a power level of the input signal received. A performance indicator is provided, which includes information on a performance of the electronic component in dependence of the at least one power level parameter. A signal level performance information is determined with respect to the electronic component based on the at least one determined power level parameter and based on the performance indicator. Further, a monitoring system is described.

Method and monitoring system for providing signal level performance information

A measurement system includes an input port, a signal splitter, first and second signal paths, an analysis circuit, and a control circuit. The input port is configured to receive an input signal to be measured. The signal splitter is configured to split the input signal into a first signal that is forwarded to the first signal path and a second signal that is forwarded to the second signal path. The analysis circuit is connected to the first signal path and the second signal path so as to receive both a first processed signal and a second processed signal. The analysis circuit is configured to a complex-valued product signal from the processed signals average the complex-valued product signal over a predetermined number of samples, and determine an averaged power signal based thereon. The control circuit is configured to directly or indirectly add an offset to the averaged power signal.

Measurement system and method of determining a corrected averaged power signal

A phase coherent synthesizer with good phase noise and spurious performance is described. The phase coherent synthesizer includes digital direct synthesizer (DDS) circuitry, frequency multiplier circuitry, an oscillator, and a mixing stage. The digital direct synthesizer (DDS) circuitry has a first output and a second output. The first output is associated with a fine resolution synthesis. The second output is associated with a step synthesis. A second output signal provided via the second output has a higher frequency compared with a first output signal provided via the first output. The frequency multiplier circuitry is connected with the second output. The frequency multiplier circuitry is configured to multiply the second output signal received via the second output, thereby generating a multiplied output signal. The mixing stage has two input ports connected with the frequency multiplier circuitry and the oscillator respectively. The mixing stage includes, for example, circuitry configured to mix the multiplied output signal and an oscillator output signal of the oscillator, thereby generating an intermediate frequency signal. The first output signal and the intermediate frequency signal are synchronized with each other.

Phase coherent synthesizer

The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Method as well as test system for testing a device under test

An external frontend device is described. The external frontend device includes an integrated synthesizer circuit, a reference signal input, a receiver channel, a transmitter channel, and at least one mixer circuit. The reference signal input is configured to receive a low-frequency reference signal. The reference signal input is configured to forward the received low-frequency reference signal to the integrated synthesizer circuit. The integrated synthesizer circuit is configured to generate a local oscillator (LO) signal based on the low-frequency reference signal. The at least one mixer circuit is associated with the receiver channel and/or with the transmitter channel. The at least one mixer circuit is configured to mix the LO signal with a radio frequency (RF) signal processed by the receiver channel and/or with an intermediate frequency (IF) signal processed by the transmitter channel, thereby obtaining an IF output signal and/or an RF output signal, respectively. Further, a frontend system is described.

External frontend device and frontend system

A wideband spectrum analyzer includes at least one signal input, and at least one signal channel with a first filter module and a second filter module. The first filter module and the second filter module are connected with the at least one signal input downstream of the at least one signal input in a series connection. The first filter module includes first switches, and several different highpass filters being arranged in a parallel connection. The first switches are configured to selectively connect one of the highpass filters with an input of the first filter module and an output of the first filter module. The second filter module includes second switches, and several different lowpass filters being arranged in a parallel connection. The second switches are configured to selectively connect one of the lowpass filters with an input of the second filter module and an output of the second filter module.

Wideband spectrum analyzer

A measurement device with automatic optimization capabilities comprises at least one signal processing component with a physical detector and a virtual detector component comprising at least one virtual detector for a signal processing component without physical detector. The physical detector is configured to physically measure a measurement value assigned to the signal processing component. The virtual detector component is configured to use a model of a signal processing chain from the physical detector to the location of the virtual detector. The model comprises at least one model parameter for the signal processing chain. The measurement device is configured to adapt the virtual detector component with respect to a measurement type for the signal to be measured. The virtual detector component is configured to use the model and the at least one measurement value. The virtual detector component is configured to determine a virtually determined value based on the model and the at least one measurement value. The measurement device is configured to use the virtually determined value to determine a setting for the measurement device. In addition, a method of setting a measurement device is described.

Measurement device and method of setting a measurement device

A sampling device comprises a clock source that provides a clock frequency, a converter with a receiving port for receiving the clock frequency, and a re-sampler located in a digital domain of the sampling device. The clock source is configured to vary the clock frequency over time. The clock source is configured to forward the clock frequency to the converter in order to change a sampling rate of the converter in dependency of the clock frequency. An output sample rate of the sampling device is fixed.

Sampling device

A method for testing a device under test by using a test system is disclosed. The method comprises: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a vector signal analyzer; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

A measuring device with jitter compensation is provided. The measuring device including at least one analog-to-digital converter, a clock source, and at least one phase shifter. In this context, the at least one phase shifter is configured to receive a clock signal from the clock source and to adjust the respective phase.

Measuring device, calibration method and measuring method with jitter compensation

A test and measurement device is described that includes a radio frequency input for receiving a radio frequency signal, a mixer to mix the radio frequency signal into a first intermediate frequency signal, a splitter to split the first intermediate frequency signal into several split signals, several signal paths for processing the several split signals, and a recombiner that is configured to recombine the split signals in order to create an output signal having a frequency span substantially representing the one of the radio frequency signal. Further, a method for calibrating a test and measurement device and a method for analyzing a high bandwidth of a radio frequency signal are described.

Test and measurement device, method for calibrating a test and measurement device as well as method for analyzing a high bandwidth of a radio frequency signal

A measuring system comprises a noise source adapted to provide a noise signal to a device under test. Moreover, it comprises a measuring device adapt to measure a measuring signal generated by the device under test in reaction to the noise signal. The measuring device further comprises a signal splitter adapted to split the measuring signal into at least a first split measuring signal and a second split measuring signal. Moreover it comprises a correlator adapted to correlate a signal derived from the first split measuring signal and a signal derived from the second split measuring signal. Also the measuring device comprises a processor adapted to determine an amplification factor and/or a noise figure of the device under test based upon the correlated signal derived from the first split measuring signal and signal derived from the second split measuring signal.

Measuring system and measuring method for measuring amplification and noise by correlation

A measuring device for suppressing an interference signal contains a mixer, an analog-digital converter, a scaling device and a substitution device. The mixer is embodied to mix a first signal with a first intermediate frequency and to mix a second signal with a second intermediate frequency. The analog-digital converter is embodied to digitize the first signal mixed with the first intermediate frequency to form a first test signal and to digitize the second signal mixed with the second intermediate frequency to form a second test signal is embodied to displace at least the first test signal and/or the second test signal in its frequency in such a manner that they provide a common mid-frequency. The substitution device is embodied to combine the first test signal and the second test signal with a removal of interference-signal peak-value regions which correspond to the interference signal, to form a combined test signal.

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Dorfen, Germany

Alexander Roth