Lockheed Martin Corporation

Alexander M Elhage

Michael J Riess

The disclosure is directed to systems and methods for image capturing technologies and, more particularly, to a slice scan imaging system and respective processes to achieve high quality images. The method can be implemented in a computing device, which includes: capturing multiple lines of an image in a single slice; capturing multiple slices; stitching together the multiple slices by aligning common features of the images of a previous slice with a successive slice; and blending together the stitched together multiple slices.

Slice scan imaging system and methods of use

The invention is directed to systems and methods for image capturing technologies and, more particularly, to a high speed image registration system and respective processes to achieve high quality images. The method is implemented in a computing device and includes: capturing a first image of an object and identifying interest points; capturing a second image of the object and identifying regions of interest associated with the identified interest points of the first image, in addition to any areas not captured in the first image; identifying interest points in the second image within the regions of interest of the second image; matching interest points between the first image and the second image; aligning the matched interest points between the first image and the second image; and blending together the first image and the second image using the aligned similar interest points to form a single image of the object.

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Endicott, NY, United States of America

Alexander M Elhage