Leybold Gmbh

Carl Zeiss Smt Gmbh

Carl Zeiss Microscopy Gmbh

Alexander Laue

Stefan Butzmann

Michel Aliman

Hin Yiu Anthony Chung

Gennady Fedosenko

Leonid Gorkhover

Ruediger Reuter

Dirk Preikszas

Martin Antoni

Ulrike Zeile

Christian Hendrich

Thorsten Benter

Hubert Mantz

Peter Awakowicz

Albrecht Glasmachers

Holger Dömer

Rudiger Reuter

Andreas Gorus

Valerie Derpmann

Achim Von Keudell

Yessica Brachthauser

Marc Boeke

Anthony Hin Yiu Chung

Joerg Winter

Andreas Schuetz

Jörg Winter

Theodore Lundquist

Michael Schmidt

Albrecht Brockhaus

Rüdiger Reuter

Marc BÖKE

The invention relates to a particle detector, comprising: a measuring electrode for measuring charged particles, a detection device for detecting the charged particles measured by the measuring electrode, and an evaluation device for determining the number of charged particles detected by the detection device. The detection device has a charge amplifier for converting a charge signal generated by the charged particles into a voltage signal and an amplifier device for amplifying the voltage signal.

Particle detector for detecting charged particles

The invention concerns an ion trap, including a first ring-shaped end cap electrode and a second ring-shaped end cap electrode, between which is formed a ring-shaped ion storage cell, as well as a plurality of radially inner disk-shaped ring electrodes and a plurality of radially outer disk-shaped ring electrodes, which delimit the ring-shaped ion storage cell. The invention also relates to a mass spectrometer that has such an ion trap as well as a control device that is designed to actuate the disk-shaped ring electrodes and the end cap electrodes for the storage, selection, excitation and/or detection of ions in the ring-shaped ion storage cell.

Ion trap with ring-shaped ion storage cell and mass spectrometer

A mass spectrometer includes an ion trap, which has an interior for storing ions, a signal generator, which is connected to an electrode of the ion trap, which delimits the interior, for coupling in a voltage signal, in particular a radiofrequency voltage signal, and an ionization device for ionizing a gas to be ionized and supplied to the interior. The ionization device is connected to the signal generator in order to use the voltage signal (U, U, U) of the signal generator, which is coupled into the electrode, for generating ions.

Mass spectrometer comprising an ionization device

A method for analyzing a gas by mass spectrometry includes exciting ions of the gas to be analyzed in an FT ion trap, and recording a first frequency spectrum in a first measurement time interval during or after the excitation of the ions. The first frequency spectrum contains ion frequencies of the excited ions and interference frequencies. The method also includes recording a second frequency spectrum in a second measurement time interval. The second frequency spectrum contains the interference frequencies, but not the ion frequencies of the first frequency spectrum. The method further includes comparing the first frequency spectrum with the second frequency spectrum to identify the interference frequencies in the first frequency spectrum. The disclosure also relates to a mass spectrometer which is suitable for carrying out the method for analyzing the gas by mass spectrometry.

Method for analyzing a gas by mass spectrometry, and mass spectrometer

An ionization device includes: a plasma generating device for generating metastable particles and/or ions of an ionization gas in a primary plasma region; a field generating device for generating a glow discharge in a secondary plasma region; an inlet for supplying a gas to be ionized into the secondary plasma region; and a further inlet for supplying the metastable particles and/or the ions of the ionization gas into the secondary plasma region. A mass spectrometer includes such an ionization device and a detector downstream of the outlet of the ionization device for the mass-spectrometric analysis of the ionized gas.

Ionization device with mass spectrometer therewith

A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the produced ions in an FT ion trap. Producing and storing the ions in the FT ion trap and/or exciting the ions prior to the detection of the ions in the FT ion trap includes at least one selective IFT excitation, such as a SWIFT excitation, which is dependent on the mass-to-charge ratio of the ions. The disclosure further relates to a mass spectrometer. A mass spectrometer includes: an FT ion trap; and an excitation device for storing, exciting, and detecting ions in the FT ion trap.

Method for examining a gas by mass spectrometry and mass spectrometer

An apparatus for focusing and for storage of ions and an apparatus for separation of a first pressure area from a second pressure area are disclosed, in particular for an analysis apparatus for ions. A particle beam device may have at least one of the abovementioned apparatuses. A container for holding ions and at least one multipole unit are provided. The multipole unit has a through-opening with a longitudinal axis as well as a multiplicity of electrodes. A first set of the electrodes is at a first radial distance from the longitudinal axis. A second set of the electrodes is in each case at a second radial distance from the longitudinal axis. The first radial distance is less than the second radial distance. Alternatively or additionally, the apparatus may have an elongated opening with a radial extent. The opening has a longitudinal extent which is greater than the radial extent.

Printed circuit board multipole for ion focusing

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Heidenheim, Germany

Alexander Laue