Rohde and Schwarz Gmbh & Co. Kg

Alexander Kunze

Martin Peschke

Stefan Ketzer

Benedikt Lippert

Alexander Stuka

Roland Krimmer

Andreas Ziegler

Thomas Reichel

Werner Perndl

Alexander Schild

Mirko Soellner

Renate Mittermair

Gottfried Czech

Burkhard Kuefner

A probe tip module includes a probe tip interface and a probe tip memory. The probe tip interface is connectable to a probe main module. A reduced characterization data set is stored in the probe tip memory. The prove tip module may be part of a probe system or a measurement system.

Probe tip module, probe system, and measurement system

The present disclosure provides a differential measurement probe comprising a first support plate, a second support plate arranged in parallel to the first support plate, a first printed circuit probe tip that comprises a first contact section for contacting a device under test, and a second printed circuit probe tip that comprises a second contact section for contacting a device under test, wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate.

Differential measurement probe

The present disclosure provides a method for manufacturing a measurement probe, the method comprising cutting a carrier substrate to form a probe contour, the probe contour comprising at least one probe tip and a probe body, and metallizing the surface of the at least one probe tip of the probe contour. Further, the present disclosure provides a respective measurement probe.

Method for manufacturing a measurement probe, and measurement probe

The present disclosure provides a probe extension system that allows extending the distance between a measurement device and a measurement probe. The probe extension system comprises a first releasable adaptor comprising a device-side electromechanical interface that is releasably couplable to a measurement interface of the measurement device, and a first cable-side electromechanical interface that is releasably couplable to an extension cable harness and that is in the first releasable adaptor electrically coupled to the device-side electromechanical interface, and a second releasable adaptor comprising a second cable-side electromechanical interface that is releasably couplable to the extension cable harness, and a probe-side electromechanical interface that is releasably couplable to the measurement probe and that is in the second releasable adaptor electrically coupled to the second cable-side electromechanical interface. Further, the present disclosure provides a respective measurement system and a probe extension method.

Probe extension system, measurement system and probe extension method

A radio frequency connector for establishing a radio frequency connection with a radio frequency device is described. The radio frequency connector includes a radio frequency connection interface, an interchangeable radio frequency adapter and a positioning member. The interchangeable radio frequency adapter is detachably attached with the radio frequency connection interface such that the interchangeable radio frequency adapter is configured to be detached from the radio frequency connection interface in a disassembled state of the radio frequency connector. The positioning member is configured to position the interchangeable radio frequency adapter with respect to the radio frequency connection interface in an assembled state of the radio frequency connector. The positioning member is detachably attached such that the positioning member is configured to be detached in the disassembled state of the radio frequency connector, thereby releasing the interchangeable radio frequency adapter with respect to the radio frequency connection interface. Further, a measurement system for radio frequency measurement is described.

Radio frequency connector and measurement system

A high bandwidth differential test probe for measuring a device under test is provided. The test probe comprises a first probe tip arranged at a first coaxial connector relative to a first rotational axis, and a second probe tip arranged at a second coaxial connector relative to a second rotational axis. For adjusting the distance between the first probe tip and the second probe tip, the first coaxial connector is rotatable with respect to the first rotational axis and the second coaxial connector is rotatable with respect to the second rotational axis. Additionally, a tilt angle between the first probe tip and a plane comprising both the first and second rotational axes, and a tilt angle between the second probe tip and the plane, is not equal to zero.

Differential test probe

A dynamic probe for probing a dynamic data signal comprising a switching unit configured to provide at least two different input impedances, wherein the switching unit is configured to select a first input impedance in a first mode and a second input impedance in a second mode, the switching unit being configured to be operated dynamically based on an event in the data signal processed. Further, a dynamic measurement system and a method for probing a dynamic data signal are described.

Dynamic probe, dynamic measurement system and method for probing a dynamic data signal

A measurement equipment configured to be connected to a measurement device and an HF coaxial connection element and a torque limiter. The torque limiter is configured for connecting the HF coaxial connection element with the measurement device with a predetermined torque. Furthermore, the invention provides an HF coaxial connection element configured to be connected to a corresponding HF coaxial connection element. The HF coaxial connection element comprises a torque limiter configured for detachably connecting the HF coaxial connection element with the corresponding HF coaxial connection element with a predetermined torque, a centering element for centering the HF coaxial connection element with respect to the corresponding HF coaxial connection element and a twist protection element for preventing twisting motion between the HF coaxial connection element and the corresponding HF coaxial connection element. A corresponding torque limiter is also provided.

Measurement equipment, HF coaxial connection element and torque limiter for an HF coaxial connection element

Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Test arrangement and test method

A broadband connector system is provided. Said broadband connector system comprises a broadband socket connector comprising a socket strip conductor element comprising a socket lateral dimension, and a broadband plug connector comprising a plug strip conductor element comprising a plug lateral dimension. In this context, the broadband socket connector is connectable to the broadband plug connector, wherein the socket lateral dimension is greater or equal to the plug lateral dimension.

Broadband socket connector, broadband plug connector, and system thereof

An electrical measurement system for performing a measurement on a device under test has a main unit, a probe unit connected to the main unit, a first offset generator for generating a first offset influencing the measurement, and a second offset generator for generating a second offset influencing the measurement. The first offset generator has a first analog step size and the second offset generator has a second analog step size. The first and second analog step sizes differ from one another.

Electrical measurement system and method for establishing a desired total offset

A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.

Differential probe with common-mode offset

The invention relates to a power meter with a two-path or multipath detector comprising at least two detector elements. Each detector element generates an output voltage. In order to detect an electrical power of an alternating electrical input signal, the sum and the difference of the output voltages of the detector elements are formed separately from one another.

Power meter with two detector elements for a power measurement even of extremely low frequencies

An adapter for a sensor measuring a differential signal comprises two electrically conductive test-contact elements which are arranged in each case eccentrically relative to an axis of rotation in order to register respectively one partial signal of the differential signal. Moreover, two adjustment components, each rotatable about one of the two axes of rotation, are provided in the adapter for the adjustment of a variable spacing distance between the two test-contact elements. The two adjustment components are connected to one another in a force-fit manner.

Adapter for a sensor for measuring a differential signal

A switching unit serves for the arithmetic linking of at least two input signals supplied to the switching unit. For this purpose, the switching unit provides a switching matrix to which the at least two input signals are supplied. The switching matrix applies at least one summation operation to at least two input signals and/or at least one multiplication operation to at least one input signal. Additionally or alternatively, the switching matrix can also connect at least one input signal directly through to a first output. The switching matrix comprises for this purpose several current switches.

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Munich, Germany

Alexander Kunze