International Business Machines Corporation

Alexander Joseph Franz

Karl V Swanke

Mark J Flemming

Steven Bruce Oshry

Tyler D Kieft

Raghav Kohli

Matthew S Turnbull

Matthew Walker

Systems, methods, and apparatus are described herein data extraction and analysis, and more particularly, to the generation of compliant and optimized peer data.

Compliant and optimized peer data generation

A tool and method is provided to graphically correlate process and test data with specific chips on a multi-project wafer. The tool and method is configured and implemented to select certain sites and export these sites to an industry standard map that can be used in a variety of chip picking or test tools. In one embodiment, the method includes importing a wafer floor plan with chips of different design parameters and importing manufacturing logistical information of the chips. The method further includes graphically rendering each chip on the wafer to scale within a unit cell using the imported wafer floor plan and the manufacturing logistical information.

Tool and method to graphically correlate process and test data with specific chips on a wafer

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Purcellville, NY, United States of America

Alexander Joseph Franz