Quantum-Si Incorporated

Alexander Gondarenko

Jonathan Marc Rothberg

Keith Glen Fife

Jack L Jewell

Gerard M Schmid

Lawrence Camest West

Jeremy Lackey

Ali Kabiri

Jason W Sickler

Paul E Glenn

Benjamin Cipriany

Farshid Ghasemi

Kyle Preston

James Beach

Jonathan M Rothberg

An integrated device and related instruments and systems for analyzing samples in parallel are described. The integrated device may include sample wells arranged on a surface of where individual sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light. The integrated device may further include photodetectors positioned in a layer of the integrated device, where one or more photodetectors are positioned to receive a photon of emission light emitted from a sample well. The integrated device further includes one or more photonic structures positioned between the sample wells and the photodetectors, where the one or more photonic structures are configured to attenuate the excitation light relative to the emission light such that a signal generated by the one or more photodetectors indicates detection of photons of emission light.

Optical rejection photonic structures using two spatial filters

Growing community of inventors

Portland, OR, United States of America

Alexander Gondarenko