Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.

Technishe Universitaet Darmstadt

Alexander Ennen

Markus Firsching

Johannes Leisner

Malte Vogelgesang

Steffen Rüger

Wladislaw Benner

Christoph Speier

A processing device for obtaining gap-filler sinogram information is adapted to obtain first sinogram information associated with a first spectral parameter, and second sinogram information associated with a second spectral parameter, and is adapted to obtain the gap-filler sinogram information which is associated with the second spectral parameter and which fills the one gap in the second sinogram information, on the basis of the first sinogram information and the second sinogram information. A computer program, a method, and a computer implementation are also described.

Processing device for obtaining gap filler sinogram information, computer tomograph, method and computer program

Apparatus and method for assigning a material value score to a waste printed circuit board or a portion thereof and system for sorting waste printed circuit boards.

Apparatus and method for assigning a material value score to a waste printed circuit board or a portion thereof and system for sorting waste printed circuit boards

Growing community of inventors

Erlangen, Germany

Alexander Ennen